Author: Mitsuhashi, T.M.
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TUPF23 Beam Size Measurements using Synchrotron Radiation Interferometry at ALBA 374
 
  • L. Torino, U. Iriso
    ALBA-CELLS Synchrotron, Cerdanyola del Vallès, Spain
  • T.M. Mitsuhashi
    KEK, Ibaraki, Japan
 
  First tests to measure the transverse beam size using interferometry at ALBA showed that the measurement reliability was limited by the inhomogeneous light wavefront arriving at the double slit system. For this reason, the optical components guiding the synchrotron radiation have been exchanged, and detailed quality checks have been carried out using techniques like the Fizeau interferometry or Hartmann mask tests. We report the results of the analysis of the optical elements installed in the beamline, and the beam size measurements performed using double slit interferometry in both horizontal and vertical planes.  
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TUPD08 YAG:Ce Screen Monitor Using a Gated CCD Camera 426
 
  • T. Naito, T.M. Mitsuhashi
    KEK, Ibaraki, Japan
 
  Due to its good spatial resolution, the YAG:Ce screen monitor is often used for small beam profile measurement in the Linac and beam transport line. We constructed a high-resolution YAG:Ce screen monitor at KEK-ATF2 for the observation of small size beams a. We tested two types of screens, one is powder YAG:Ce and the other is single crystal YAG:Ce. Both screens have 50μm thickness. To escape from strong COTR, we applied delayed timing of the gate for the CCD camera. A microscope having a spatial resolution of 6μm was set outside of a vacuum chamber to observe the scintillation light from the YAG:Ce screen. The results of the difference between the two screens, the camera performance with delayed gate, and the optical performance of the microscope will be presented in this session.  
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