Paper | Title | Page |
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TUCYB3 | SwissFEL Beam Profile Monitor | 259 |
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We have developed a beam profile monitor that allows us to measure two-dimensional electron beam profiles for highly compressed electron bunches. Such bunches have plagued profile measurements in optical transition radiation monitors in the past, because coherent radiation entering the optical system has invalidated the images and even destroyed cameras. The present design makes use of a scintillating crystal, and directs coherent transition radiation away from the optical axis by careful choice of the angle. When observing Snell's law of refraction as well as the Scheimpflug imaging condition, a resolution better than the thickness of the scintillator can be achieved. We will present measurements performed at the SwissFEL Injector Test Facility and at the Linac Coherent Light Source. The high resolution and excellent sensitivity of this monitor make it ideal for installation in SwissFEL. | ||
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Slides TUCYB3 [42.624 MB] | |
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WEIXB1 | LCLS Beam Diagnostics | 475 |
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Funding: Work supported by DOE contract DE-AC03-76SF00515 An extensive set of beam diagnostics has been one of the factors in the successful commissioning and operation of the Linac Coherent Light Source (LCLS) x-ray FEL over the last seven years. The originally developed and installed diagnostics were geared towards measuring the electron beam parameters of the LCLS design specifications. Since then, a number of improved and new diagnostics have been implemented to accommodate a much wider range of beam parameters and to overcome the challenges of diagnostics for a high brightness electron beam. Plans for the diagnostics of the LCLS-II project with its high repetition rate and high beam power and ongoing developments will also be discussed. |
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Slides WEIXB1 [4.408 MB] | |
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