IBIC2014 - List of Authors (Ischebeck, R.)

Paper	Title	Page
MOPF31	Overview of Beam Instrumentation Activities for SwissFEL	119
	R. Ischebeck, R. Abela, F. Ardana-Lamas, V.R. Arsov, R. Baldinger, H.-H. Braun, M. Calvi, R. Ditter, C. Erny, F. Frei, R. Ganter, I. Gorgisyan, C.P. Hauri, S. Hunziker, P.N. Juranic, B. Keil, W. Koprek, R. Kramert, D. Llorente Sancho, F. Löhl, F. Marcellini, G. Marinkovic, B. Monoszlai, G.L. Orlandi, C. Ozkan, L. Patthey, M. Pedrozzi, P. Pollet, M. Radovic, L. Rivkin, M. Roggli, M. Rohrer, V. Schlott, A.G. Stepanov, J. Stettler PSI, Villigen PSI, Switzerland F. Ardana-Lamas, I. Gorgisyan, C.P. Hauri, L. Rivkin EPFL, Lausanne, Switzerland P. Peier DESY, Hamburg, Germany
	SwissFEL will provide users with brilliant X-ray pulses in 2017. A comprehensive suite of diagnostics is needed for the initial commissioning, for changes to the operating point, and for feedbacks. The development of instrumentation for SwissFEL is well underway, and solutions have been identified for most diagnostics systems. I will present here an overview of the instrumentation for SwissFEL, and give details on some recent developments.
	Poster MOPF31 [4.418 MB]
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TUCYB3	SwissFEL Beam Profile Monitor	259
	R. Ischebeck, E. Prat, V. Schlott, V.G. Thominet PSI, Villigen PSI, Switzerland P. Krejcik, H. Loos SLAC, Menlo Park, California, USA M. Yan DESY, Hamburg, Germany
	We have developed a beam profile monitor that allows us to measure two-dimensional electron beam profiles for highly compressed electron bunches. Such bunches have plagued profile measurements in optical transition radiation monitors in the past, because coherent radiation entering the optical system has invalidated the images and even destroyed cameras. The present design makes use of a scintillating crystal, and directs coherent transition radiation away from the optical axis by careful choice of the angle. When observing Snell's law of refraction as well as the Scheimpflug imaging condition, a resolution better than the thickness of the scintillator can be achieved. We will present measurements performed at the SwissFEL Injector Test Facility and at the Linac Coherent Light Source. The high resolution and excellent sensitivity of this monitor make it ideal for installation in SwissFEL.
	Slides TUCYB3 [42.624 MB]
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Paper

Title

Page

Overview of Beam Instrumentation Activities for SwissFEL

119

R. Ischebeck, R. Abela, F. Ardana-Lamas, V.R. Arsov, R. Baldinger, H.-H. Braun, M. Calvi, R. Ditter, C. Erny, F. Frei, R. Ganter, I. Gorgisyan, C.P. Hauri, S. Hunziker, P.N. Juranic, B. Keil, W. Koprek, R. Kramert, D. Llorente Sancho, F. Löhl, F. Marcellini, G. Marinkovic, B. Monoszlai, G.L. Orlandi, C. Ozkan, L. Patthey, M. Pedrozzi, P. Pollet, M. Radovic, L. Rivkin, M. Roggli, M. Rohrer, V. Schlott, A.G. Stepanov, J. Stettler
PSI, Villigen PSI, Switzerland
F. Ardana-Lamas, I. Gorgisyan, C.P. Hauri, L. Rivkin
EPFL, Lausanne, Switzerland
P. Peier
DESY, Hamburg, Germany

SwissFEL will provide users with brilliant X-ray pulses in 2017. A comprehensive suite of diagnostics is needed for the initial commissioning, for changes to the operating point, and for feedbacks. The development of instrumentation for SwissFEL is well underway, and solutions have been identified for most diagnostics systems. I will present here an overview of the instrumentation for SwissFEL, and give details on some recent developments.

Poster MOPF31 [4.418 MB]

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TUCYB3

SwissFEL Beam Profile Monitor

259

R. Ischebeck, E. Prat, V. Schlott, V.G. Thominet
PSI, Villigen PSI, Switzerland
P. Krejcik, H. Loos
SLAC, Menlo Park, California, USA
M. Yan
DESY, Hamburg, Germany

We have developed a beam profile monitor that allows us to measure two-dimensional electron beam profiles for highly compressed electron bunches. Such bunches have plagued profile measurements in optical transition radiation monitors in the past, because coherent radiation entering the optical system has invalidated the images and even destroyed cameras. The present design makes use of a scintillating crystal, and directs coherent transition radiation away from the optical axis by careful choice of the angle. When observing Snell's law of refraction as well as the Scheimpflug imaging condition, a resolution better than the thickness of the scintillator can be achieved. We will present measurements performed at the SwissFEL Injector Test Facility and at the Linac Coherent Light Source. The high resolution and excellent sensitivity of this monitor make it ideal for installation in SwissFEL.

Slides TUCYB3 [42.624 MB]

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reference for this paper to ※ LaTeX, ※ Text, ※ IS/RefMan, ※ EndNote (xml)