IBIC2013 - List of Authors (Smit, B.)

Paper

Title

Page

Instrumentation and Results from the SwissFEL Injector Test Facility

12

R. Ischebeck, V.R. Arsov, S. Bettoni, B. Beutner, M.M. Dehler, A. Falone, F. Frei, I. Gorgisyan, Ye. Ivanisenko, P.N. Juranic, B. Keil, F. Löhl, G.L. Orlandi, M. Pedrozzi, P. Pollet, E. Prat, T. Schietinger, V. Schlott, B. Smit
PSI, Villigen PSI, Switzerland
P. Peier
DESY, Hamburg, Germany

The SwissFEL Injector Test Facility (SITF) has been equipped with numerous prototype diagnostics (BPMs, screen monitors, wire scanners, optical synchrotron radiation monitor, compression (THz) monitor, bunch arrival time monitor, EO spectral decoding monitor, charge and loss monitor) specifically designed for the low charge SwissFEL operation modes. The design of the diagnostics systems and recent measurement results will be presented.

Slides MOBL1 [35.165 MB]

TUPC40

Bunch Length Measurements Using Correlation Theory in Incoherent Optical Transition Radiation

471

B. Smit, F. Frei, R. Ischebeck, G.L. Orlandi, V. Schlott
PSI, Villigen PSI, Switzerland

Funding: Paul Scherrer Institut (PSI)
As Free Electron Lasers create ultra-short bunch lengths, the longitudinal diagnostic for such femto-second bunches becomes more difficult. We suggest a bunch length method using the spectral analysis of incoherent Optical Transition Radiation (OTR) in the visible frequency domain. The frequency response of OTR is taken by inserting an aluminium coated silicon wafer into the electron beam. The OTR light is collected with mirror optics into an optical fibre, which is coupled to a spectrometer (334 THz to 1500 THz). The resolution of the spectrometer allows us to measure bunch length lower than 100 fs rms. Bunch length was varied from 100 femto-seconds down to a few femto-seconds. The spectral response of Optical Transition Radiation (OTR) showed an increase of the correlation between neighbouring frequencies as bunch length was reduced.

WEPC36

Development of Electron Bunch Compression Monitors for SwissFEL

769

F. Frei, B. Beutner, I. Gorgisyan, R. Ischebeck, G.L. Orlandi, P. Peier, E. Prat, V. Schlott, B. Smit
PSI, Villigen PSI, Switzerland
P. Peier
DESY, Hamburg, Germany

SwissFEL will be a hard x-ray fourth generation light source to be built at Paul Scherrer Institut (PSI), Switzerland. In SwissFEL the electron bunches will be produced with a length of 3ps and will then be compressed by a factor of more than 1000 down to a few fs in order to generate ultra short x-ray pulses. Therefore reliable, accurate and noninvasive longitudinal diagnostic is essential after each compressing stage. In order to meet the requirements of this machine, new monitors have to be developed. We will present recent results of setups that measure electro-magnetic radiation, namely edge, synchrotron and diffraction radiation, emitted by the electron bunches (far field, spectral domain). These monitors are tested in the SwissFEL Injector Test Facility. A state of the art S-band Transverse Deflecting Cavity together with a Screen Monitor is used for calibration.

Paper	Title	Page
MOBL1	Instrumentation and Results from the SwissFEL Injector Test Facility	12
	R. Ischebeck, V.R. Arsov, S. Bettoni, B. Beutner, M.M. Dehler, A. Falone, F. Frei, I. Gorgisyan, Ye. Ivanisenko, P.N. Juranic, B. Keil, F. Löhl, G.L. Orlandi, M. Pedrozzi, P. Pollet, E. Prat, T. Schietinger, V. Schlott, B. Smit PSI, Villigen PSI, Switzerland P. Peier DESY, Hamburg, Germany
	The SwissFEL Injector Test Facility (SITF) has been equipped with numerous prototype diagnostics (BPMs, screen monitors, wire scanners, optical synchrotron radiation monitor, compression (THz) monitor, bunch arrival time monitor, EO spectral decoding monitor, charge and loss monitor) specifically designed for the low charge SwissFEL operation modes. The design of the diagnostics systems and recent measurement results will be presented.
	Slides MOBL1 [35.165 MB]

TUPC40	Bunch Length Measurements Using Correlation Theory in Incoherent Optical Transition Radiation	471
	B. Smit, F. Frei, R. Ischebeck, G.L. Orlandi, V. Schlott PSI, Villigen PSI, Switzerland
	Funding: Paul Scherrer Institut (PSI) As Free Electron Lasers create ultra-short bunch lengths, the longitudinal diagnostic for such femto-second bunches becomes more difficult. We suggest a bunch length method using the spectral analysis of incoherent Optical Transition Radiation (OTR) in the visible frequency domain. The frequency response of OTR is taken by inserting an aluminium coated silicon wafer into the electron beam. The OTR light is collected with mirror optics into an optical fibre, which is coupled to a spectrometer (334 THz to 1500 THz). The resolution of the spectrometer allows us to measure bunch length lower than 100 fs rms. Bunch length was varied from 100 femto-seconds down to a few femto-seconds. The spectral response of Optical Transition Radiation (OTR) showed an increase of the correlation between neighbouring frequencies as bunch length was reduced.

WEPC36	Development of Electron Bunch Compression Monitors for SwissFEL	769
	F. Frei, B. Beutner, I. Gorgisyan, R. Ischebeck, G.L. Orlandi, P. Peier, E. Prat, V. Schlott, B. Smit PSI, Villigen PSI, Switzerland P. Peier DESY, Hamburg, Germany
	SwissFEL will be a hard x-ray fourth generation light source to be built at Paul Scherrer Institut (PSI), Switzerland. In SwissFEL the electron bunches will be produced with a length of 3ps and will then be compressed by a factor of more than 1000 down to a few fs in order to generate ultra short x-ray pulses. Therefore reliable, accurate and noninvasive longitudinal diagnostic is essential after each compressing stage. In order to meet the requirements of this machine, new monitors have to be developed. We will present recent results of setups that measure electro-magnetic radiation, namely edge, synchrotron and diffraction radiation, emitted by the electron bunches (far field, spectral domain). These monitors are tested in the SwissFEL Injector Test Facility. A state of the art S-band Transverse Deflecting Cavity together with a Screen Monitor is used for calibration.