Author: Jeff, A.
Paper Title Page
MOPF09 A Gas-Jet Profile Monitor for the CLIC Drive Beam 224
 
  • A. Jeff, E.B. Holzer, T. Lefèvre
    CERN, Geneva, Switzerland
  • A. Jeff, V. Tzoganis, C.P. Welsch
    The University of Liverpool, Liverpool, United Kingdom
  • V. Tzoganis, C.P. Welsch
    Cockcroft Institute, Warrington, Cheshire, United Kingdom
 
  The Compact LInear Collider (CLIC) will use a novel acceleration scheme in which energy extracted from a very intense beam of relatively low-energy electrons (the Drive Beam) is used to accelerate a lower intensity Main Beam to very high energy. The high intensity of the Drive Beam, with pulses of more than 1015 electrons, poses a challenge for conventional profile measurements such as wire scanners. Thus, new non-invasive profile measurements are being investigated. Profile monitors using gas ionisation or fluorescence have been used at a number of accelerators. Typically, extra gas must be injected at the monitor and the rise in pressure spreads some distance down the beampipe. In contrast, a gas jet can be fired across the beam into a receiving chamber, with little gas escaping into the rest of the beam pipe. In addition, a gas jet shaped into a thin plane can be used like a screen on which the beam cross-section is imaged. In this paper we present some arrangements for the generation of such a jet. In addition to jet shaping using nozzles and skimmers, we propose a new scheme to use matter-wave interference with a Fresnel Zone Plate to bring an atomic jet to a narrow focus.  
 
MOPF10 Off-Axis Undulator Radiation for CLIC Drive Beam Diagnostics 228
 
  • A. Jeff, T. Lefèvre
    CERN, Geneva, Switzerland
  • A. Jeff, C.P. Welsch
    Cockcroft Institute, Warrington, Cheshire, United Kingdom
  • A. Jeff, C.P. Welsch
    The University of Liverpool, Liverpool, United Kingdom
 
  The Compact LInear Collider (CLIC) will use a novel acceleration scheme in which energy extracted from a very intense beam of relatively low-energy electrons (the Drive Beam) is used to accelerate a lower intensity Main Beam to very high energy. The high intensity of the Drive Beam, with pulses of more than 1015 electrons, poses a challenge for conventional profile measurements such as wire scanners. Thus, new non-invasive profile measurements are being investigated. In this paper we propose the use of relatively inexpensive permanent-magnet undulators to generate off-axis visible Synchrotron Radiation from the CLIC Drive Beam. The field strength and period length of the undulator should be designed such that the on-axis undulator wavelength is in the ultra-violet. A smaller but still useable amount of visible light is then generated in a hollow cone. This light can be reflected out of the beam pipe by a ring-shaped mirror placed downstream and imaged on a camera. In this contribution, results of SRW and ZEMAX simulations using the CLIC Drive Beam parameters are shown.  
 
TUPF02 Secondary Emission Monitor for keV Ion and Antiproton Beams 495
 
  • A.G. Sosa, E. Bravin, A. Jeff
    CERN, Geneva, Switzerland
  • J. Harasimowicz, A. Jeff, A.G. Sosa, C.P. Welsch
    Cockcroft Institute, Warrington, Cheshire, United Kingdom
  • J. Harasimowicz, A. Jeff, A.G. Sosa, C.P. Welsch
    The University of Liverpool, Liverpool, United Kingdom
 
  Funding: Work supported by the EU within the DITANET and CATHI projects under contracts 215080 and 264330, HGF and GSI under contract VH-NG-328 and STFC under the Cockcroft Institute core grant ST/G008248/1.
Beam profile monitoring of low intensity keV ion and antiproton beams remains a challenging task. A Secondary electron Emission Monitor (SEM) has been designed to measure profiles of beams with intensities below 107 and energies as low as 20 keV. The monitor is based on a two stage microchannel plate (MCP) and a phosphor screen facing a CCD camera. Its modular design allows two different operational setups. In this contribution we present the design of a prototype and discuss results from measurements with protons at INFN-LNF and antiprotons at the AEgIS experiment at CERN*. This is then used for a characterization of the monitor with regard to its possible future use at different facilities.
* Measurements at the AD carried out with the AEgIS collaboration.
 
poster icon Poster TUPF02 [1.934 MB]  
 
MOPF10 Off-Axis Undulator Radiation for CLIC Drive Beam Diagnostics 228
 
  • A. Jeff, T. Lefèvre
    CERN, Geneva, Switzerland
  • A. Jeff, C.P. Welsch
    Cockcroft Institute, Warrington, Cheshire, United Kingdom
  • A. Jeff, C.P. Welsch
    The University of Liverpool, Liverpool, United Kingdom
 
  The Compact LInear Collider (CLIC) will use a novel acceleration scheme in which energy extracted from a very intense beam of relatively low-energy electrons (the Drive Beam) is used to accelerate a lower intensity Main Beam to very high energy. The high intensity of the Drive Beam, with pulses of more than 1015 electrons, poses a challenge for conventional profile measurements such as wire scanners. Thus, new non-invasive profile measurements are being investigated. In this paper we propose the use of relatively inexpensive permanent-magnet undulators to generate off-axis visible Synchrotron Radiation from the CLIC Drive Beam. The field strength and period length of the undulator should be designed such that the on-axis undulator wavelength is in the ultra-violet. A smaller but still useable amount of visible light is then generated in a hollow cone. This light can be reflected out of the beam pipe by a ring-shaped mirror placed downstream and imaged on a camera. In this contribution, results of SRW and ZEMAX simulations using the CLIC Drive Beam parameters are shown.  
 
TUPF02 Secondary Emission Monitor for keV Ion and Antiproton Beams 495
 
  • A.G. Sosa, E. Bravin, A. Jeff
    CERN, Geneva, Switzerland
  • J. Harasimowicz, A. Jeff, A.G. Sosa, C.P. Welsch
    Cockcroft Institute, Warrington, Cheshire, United Kingdom
  • J. Harasimowicz, A. Jeff, A.G. Sosa, C.P. Welsch
    The University of Liverpool, Liverpool, United Kingdom
 
  Funding: Work supported by the EU within the DITANET and CATHI projects under contracts 215080 and 264330, HGF and GSI under contract VH-NG-328 and STFC under the Cockcroft Institute core grant ST/G008248/1.
Beam profile monitoring of low intensity keV ion and antiproton beams remains a challenging task. A Secondary electron Emission Monitor (SEM) has been designed to measure profiles of beams with intensities below 107 and energies as low as 20 keV. The monitor is based on a two stage microchannel plate (MCP) and a phosphor screen facing a CCD camera. Its modular design allows two different operational setups. In this contribution we present the design of a prototype and discuss results from measurements with protons at INFN-LNF and antiprotons at the AEgIS experiment at CERN*. This is then used for a characterization of the monitor with regard to its possible future use at different facilities.
* Measurements at the AD carried out with the AEgIS collaboration.
 
poster icon Poster TUPF02 [1.934 MB]  
 
MOPF10 Off-Axis Undulator Radiation for CLIC Drive Beam Diagnostics 228
 
  • A. Jeff, T. Lefèvre
    CERN, Geneva, Switzerland
  • A. Jeff, C.P. Welsch
    Cockcroft Institute, Warrington, Cheshire, United Kingdom
  • A. Jeff, C.P. Welsch
    The University of Liverpool, Liverpool, United Kingdom
 
  The Compact LInear Collider (CLIC) will use a novel acceleration scheme in which energy extracted from a very intense beam of relatively low-energy electrons (the Drive Beam) is used to accelerate a lower intensity Main Beam to very high energy. The high intensity of the Drive Beam, with pulses of more than 1015 electrons, poses a challenge for conventional profile measurements such as wire scanners. Thus, new non-invasive profile measurements are being investigated. In this paper we propose the use of relatively inexpensive permanent-magnet undulators to generate off-axis visible Synchrotron Radiation from the CLIC Drive Beam. The field strength and period length of the undulator should be designed such that the on-axis undulator wavelength is in the ultra-violet. A smaller but still useable amount of visible light is then generated in a hollow cone. This light can be reflected out of the beam pipe by a ring-shaped mirror placed downstream and imaged on a camera. In this contribution, results of SRW and ZEMAX simulations using the CLIC Drive Beam parameters are shown.  
 
TUPF02 Secondary Emission Monitor for keV Ion and Antiproton Beams 495
 
  • A.G. Sosa, E. Bravin, A. Jeff
    CERN, Geneva, Switzerland
  • J. Harasimowicz, A. Jeff, A.G. Sosa, C.P. Welsch
    Cockcroft Institute, Warrington, Cheshire, United Kingdom
  • J. Harasimowicz, A. Jeff, A.G. Sosa, C.P. Welsch
    The University of Liverpool, Liverpool, United Kingdom
 
  Funding: Work supported by the EU within the DITANET and CATHI projects under contracts 215080 and 264330, HGF and GSI under contract VH-NG-328 and STFC under the Cockcroft Institute core grant ST/G008248/1.
Beam profile monitoring of low intensity keV ion and antiproton beams remains a challenging task. A Secondary electron Emission Monitor (SEM) has been designed to measure profiles of beams with intensities below 107 and energies as low as 20 keV. The monitor is based on a two stage microchannel plate (MCP) and a phosphor screen facing a CCD camera. Its modular design allows two different operational setups. In this contribution we present the design of a prototype and discuss results from measurements with protons at INFN-LNF and antiprotons at the AEgIS experiment at CERN*. This is then used for a characterization of the monitor with regard to its possible future use at different facilities.
* Measurements at the AD carried out with the AEgIS collaboration.
 
poster icon Poster TUPF02 [1.934 MB]