IBIC2013 - List of Authors (Fukuma, H.)

Paper

Title

Page

Beam Diagnostics of SuperKEKB Damping Ring

53

H. Ikeda, A. Arinaga, J.W. Flanagan, H. Fukuma, H. Ishii, S. Kanaeda, K. Mori, M. Tejima, M. Tobiyama
KEK, Ibaraki, Japan

The KEKB accelerator ceased operation in 2010, and is being upgraded to SuperKEKB. Adopting low emittance and high current beams, the design luminosity is set at 40 times larger than that of KEKB. We are constructing a damping ring (DR) in order to achieve a low-emittance positron beam for injection. Turn-by-turn beam position monitors (BPMs), a transverse feedback system, a synchrotron radiation monitor (SRM), a DCCT, loss monitors using ion chambers, a bunch current monitor and a tune meter will be installed for beam diagnostics at the DR. An overview of the instrumentation of the DR will be presented in this paper.

MOPF32

Development of Gated Turn-by-Turn Position Monitor System for the Optics Measurement During Collision of SuperKEKB

295

M. Tobiyama, H. Fukuma, H. Ishii, K. Mori
KEK, Ibaraki, Japan

Gated turn-by-turn monitor system to measure optics functions using non-colliding bunch has been developed for SuperKEKB accelerators. With the fast, glitch cancelling beam switch, beam position of the target bunch will be measured without affecting the fine COD measurement using narrow-band detectors. The gate timing and the bunch position detection are controlled by the Spartan-6 FPGA. The performance of the system, such as the gate timing jitter, data transfer speed from the system to EPICS IOC and the noise effect to the downstream narrow-band detector are reported.

Poster MOPF32 [1.531 MB]

WEPF15

High-Power Tests at CesrTA of X-ray Optics Elements for SuperKEKB

844

J.W. Flanagan, A. Arinaga, H. Fukuma, H. Ikeda
KEK, Ibaraki, Japan
A. Lyndaker, D.P. Peterson, N.T. Rider
Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA

X-ray beam size monitors at SuperKEKB must withstand high, sustained incident power loads. Two prototype optics elements were fabricated and tested at CesrTA, using incident X-ray power densities comparable to those expected at the SuperKEKB LER. One element was based on a silicon substrate, the other a CVD diamond substrate, with each substrate supporting a coded aperture mask pattern in gold on its surface. The diamond substrate mask showed superior performance to the silicon substrate mask, with the the mask pattern on the silicon substrate melting at the highest incident power level tested, where the diamond-substrate mask survived. We will present here the high-power test results, along with analysis of X-ray power absorption and heat transfer in the two prototype elements, and the resulting implications for the design of the optics, beam line and heat sink for SuperKEKB.

Paper	Title	Page
MOPC05	Beam Diagnostics of SuperKEKB Damping Ring	53
	H. Ikeda, A. Arinaga, J.W. Flanagan, H. Fukuma, H. Ishii, S. Kanaeda, K. Mori, M. Tejima, M. Tobiyama KEK, Ibaraki, Japan
	The KEKB accelerator ceased operation in 2010, and is being upgraded to SuperKEKB. Adopting low emittance and high current beams, the design luminosity is set at 40 times larger than that of KEKB. We are constructing a damping ring (DR) in order to achieve a low-emittance positron beam for injection. Turn-by-turn beam position monitors (BPMs), a transverse feedback system, a synchrotron radiation monitor (SRM), a DCCT, loss monitors using ion chambers, a bunch current monitor and a tune meter will be installed for beam diagnostics at the DR. An overview of the instrumentation of the DR will be presented in this paper.

MOPF32	Development of Gated Turn-by-Turn Position Monitor System for the Optics Measurement During Collision of SuperKEKB	295
	M. Tobiyama, H. Fukuma, H. Ishii, K. Mori KEK, Ibaraki, Japan
	Gated turn-by-turn monitor system to measure optics functions using non-colliding bunch has been developed for SuperKEKB accelerators. With the fast, glitch cancelling beam switch, beam position of the target bunch will be measured without affecting the fine COD measurement using narrow-band detectors. The gate timing and the bunch position detection are controlled by the Spartan-6 FPGA. The performance of the system, such as the gate timing jitter, data transfer speed from the system to EPICS IOC and the noise effect to the downstream narrow-band detector are reported.
	Poster MOPF32 [1.531 MB]

WEPF15	High-Power Tests at CesrTA of X-ray Optics Elements for SuperKEKB	844
	J.W. Flanagan, A. Arinaga, H. Fukuma, H. Ikeda KEK, Ibaraki, Japan A. Lyndaker, D.P. Peterson, N.T. Rider Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
	X-ray beam size monitors at SuperKEKB must withstand high, sustained incident power loads. Two prototype optics elements were fabricated and tested at CesrTA, using incident X-ray power densities comparable to those expected at the SuperKEKB LER. One element was based on a silicon substrate, the other a CVD diamond substrate, with each substrate supporting a coded aperture mask pattern in gold on its surface. The diamond substrate mask showed superior performance to the silicon substrate mask, with the the mask pattern on the silicon substrate melting at the highest incident power level tested, where the diamond-substrate mask survived. We will present here the high-power test results, along with analysis of X-ray power absorption and heat transfer in the two prototype elements, and the resulting implications for the design of the optics, beam line and heat sink for SuperKEKB.