Author: Walasek-Hoehne, B.     [Walasek-Höhne, B.]
Paper Title Page
THO3C01 Optical Transition Radiation for Non-relativistic Ion Beams 580
 
  • B. Walasek-Höhne, C.A. Andre, F. Becker, P. Forck, A. Reiter, M. Schwickert, R. Singh
    GSI, Darmstadt, Germany
  • A.H. Lumpkin
    Fermilab, Batavia, USA
 
  In this contribution, recent results of Optical Transition Radiation (OTR) measurements with a non-relativistic heavy-ion beam will be presented. This feasibility study was prompted by previous measurements [1] and the theoretical estimation of expected signal strengths for the GSI linear accelerator UNILAC. For this experiment, an 11.4 MeV/u Uranium beam was chosen to investigate OTR signal from several target materials and to evaluate the working regime for the used experimental setup. The OTR light was either observed directly with an Image Intensified CCD camera (ICCD) or indirectly via a spectrometer for wavelength resolved data. A moveable stripping foil allowed measurements with two different ion charge states. The theoretical q2 dependency of the OTR process predicts a six-fold increase in light yield which was confirmed experimentally. Obtained OTR beam profiles were compered to SEM-Grid data. Moreover, ICCD gating feature, as well as the emitted light spectrum ruled out contribution of any background sources with longer emission time constant e.g. blackbody radiation.
[1] C. Bal et al., "OTR from Non-relativistic Electrons", Proceedings of DIPAC03, PM04, Mainz Germany.
 
slides icon Slides THO3C01 [1.905 MB]  
 
THO3C03 Beam Induced Fluorescence - Profile Monitoring for Targets and Transport 586
 
  • F. Becker, C.A. Andre, C. Dorn, P. Forck, R. Haseitl, B. Walasek-Höhne
    GSI, Darmstadt, Germany
  • T. Dandl, T. Heindl, A. Ulrich
    TUM/Physik, Garching bei München, Germany
  • J. Egberts, T. Papaevangelou
    CEA, Gif-sur-Yvette, France
  • J. Marroncle
    CEA/IRFU, Gif-sur-Yvette, France
 
  Online profile diagnostic is preferred to monitor intense hadron beams at the Facility of Antiproton and Ion Research (FAIR). One instrument for beam profile measurement is the gas based Beam Induced Fluorescence (BIF)-monitor. It relies on the optical fluorescence of residual gas, excited by beam particles. In front of production targets for radioactive ion beams or in plasma physics applications, vacuum constraints are less restrictive and allow a sufficient number of fluorescence photons, even at minimum ionizing energies. Unwanted effects like radiation damage and radiation induced background need to be addressed as well. A profile comparison of BIF and Ionization Profile Monitor (IPM) in nitrogen and rare gases is presented. We studied the BIF method from 10-3 to 30 mbar with an imaging spectrograph. Preferable fluorescence transitions and fundamental limitations are discussed.  
slides icon Slides THO3C03 [7.371 MB]