Author: Papaevangelou, T.
Paper Title Page
THO3C03 Beam Induced Fluorescence - Profile Monitoring for Targets and Transport 586
 
  • F. Becker, C.A. Andre, C. Dorn, P. Forck, R. Haseitl, B. Walasek-Höhne
    GSI, Darmstadt, Germany
  • T. Dandl, T. Heindl, A. Ulrich
    TUM/Physik, Garching bei München, Germany
  • J. Egberts, T. Papaevangelou
    CEA, Gif-sur-Yvette, France
  • J. Marroncle
    CEA/IRFU, Gif-sur-Yvette, France
 
  Online profile diagnostic is preferred to monitor intense hadron beams at the Facility of Antiproton and Ion Research (FAIR). One instrument for beam profile measurement is the gas based Beam Induced Fluorescence (BIF)-monitor. It relies on the optical fluorescence of residual gas, excited by beam particles. In front of production targets for radioactive ion beams or in plasma physics applications, vacuum constraints are less restrictive and allow a sufficient number of fluorescence photons, even at minimum ionizing energies. Unwanted effects like radiation damage and radiation induced background need to be addressed as well. A profile comparison of BIF and Ionization Profile Monitor (IPM) in nitrogen and rare gases is presented. We studied the BIF method from 10-3 to 30 mbar with an imaging spectrograph. Preferable fluorescence transitions and fundamental limitations are discussed.  
slides icon Slides THO3C03 [7.371 MB]