Author: Kim, E.-S.
Paper Title Page
MOP066 Electron Bunch Length Measurement using an RF Deflecting Cavity 188
  • S. Park, E.-S. Kim
    Kyungpook National University, Daegu, Republic of Korea
  • S. Bae, K.H. Jang, Y.U. Jeong, H.W. Kim, J. Mun, N. Vinokurov
    KAERI, Daejon, Republic of Korea
  Recently, the RF photogun based-ultrafast electron diffraction (UED) system has been developed in KAERI. In the system, the emitted electron bunches are experimentally confirmed to be accelerated up to 3 MeV at 5MW of RF power. And the time duration of the each bunch is initially designed to be less than 50 fs at the sample position. To analyses the performance of the system and to measure exactly the length of the electron bunches, we developed a rectangular type of S-band deflecting cavity working on TM120 mode. The principle of electron deflecting in the cavity, design & mechanical fabrication process and test results will be present in the conference.  
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