Author: Wychowaniak, J.
Paper Title Page
THP075 Design of TDS-based Multi-screen Electron Beam Diagnostics for the European XFEL 909
 
  • J. Wychowaniak
    TUL-DMCS, Łódź, Poland
  • C. Gerth, M. Yan
    DESY, Hamburg, Germany
  
  Ded­i­cated lon­gi­tu­di­nal elec­tron beam di­ag­nos­tics is es­sen­tial for suc­cess­ful op­er­a­tion of mod­ern free-elec­tron lasers. De­mand for di­ag­nos­tic data in­cludes the lon­gi­tu­di­nal bunch pro­file, bunch length and slice emit­tance of the elec­tron bunches. Ex­per­i­men­tal se­tups based on trans­verse de­flect­ing struc­tures (TDS) are ex­cel­lent can­di­dates for this pur­pose. At the Free-Elec­tron Laser in Ham­burg (FLASH), such a lon­gi­tu­di­nal bunch pro­file mon­i­tor uti­liz­ing a TDS, a fast kicker mag­net and an off-axis imag­ing screen, has been put into op­er­a­tion. It en­ables the mea­sure­ment of a sin­gle bunch out of a bunch train with­out af­fect­ing the re­main­ing bunches. At the Eu­ro­pean X-ray Free-Elec­tron Laser (XFEL) mul­ti­screen sta­tions in com­bi­na­tion with TDS are planned to be in­stalled. In order to allow for flex­i­ble mea­sure­ments of lon­gi­tu­di­nal bunch pro­file and slice emit­tance, a con­fig­urable tim­ing and trig­ger dis­tri­b­u­tion to the fast kicker mag­nets and screen sta­tions is re­quired. In this paper, we dis­cuss var­i­ous op­er­a­tion pat­terns and the cor­re­spond­ing re­al­iza­tion based on MTCA.4 tech­nol­ogy.