Author: Huang, X.Y.
Paper Title Page
THC03 Suppression of the CSR-induced Emittance Growth in Achromats using Two-dimensional point-kick Analysis 976
 
  • Y. Jiao, X. Cui, X.Y. Huang, G. Xu
    IHEP, Beijing, People's Republic of China
  
  Co­her­ent syn­chro­tron ra­di­a­tion (CSR) ef­fect causes trans­verse emit­tance di­lu­tion in high-bright­ness light sources and lin­ear col­lid­ers. Sup­pres­sion of the emit­tance growth in­duced by CSR is es­sen­tial and crit­i­cal to pre­serve the beam qual­ity and to help im­prove the ma­chine per­for­mance. To eval­u­ate the CSR ef­fect an­a­lyt­i­cally, we pro­pose a novel method, named “two-di­men­sional point-kick analy­sis”. In this method, the CSR-in­duced emit­tance growth in an n-di­pole achro­mat can be eval­u­ated with the analy­sis of only the mo­tion of par­ti­cle in (x, x') two-di­men­sional plane with n-point kicks, which can be, to a large ex­tent, counted sep­a­rately. To demon­strate the ef­fec­tive­ness of this method, the CSR ef­fect in a two-dio­ple achro­mat and a sym­met­ric TBA is stud­ied, and generic con­di­tions of sup­press­ing the CSR-in­duced emit­tance growth, which are in­de­pen­dent of con­crete el­e­ment pa­ra­me­ters and are ro­bust against the vari­a­tion of ini­tial beam dis­tri­b­u­tion, are found. These con­di­tions are ver­i­fied with the EL­E­GANT sim­u­la­tions and can be rather eas­ily ap­plied to real ma­chines.  
slides icon Slides THC03 [1.941 MB]