TUIBNO01
RIKEN SPring-8 Center, Sayo-cho, Sayo-gun, Hyogo, Japan
*) Y. Inubushi, et al., Physical Review Letters 109, 144801 (2012)
**) T. Sato, et al., Proceedings of SRI 2012, THIC02 (2012)
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TUIBNO01 |
Beamline Instrumentation for Precise Characterization of X-ray FELs | |
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Precise diagnostic instruments for coherent X-ray pulses will be presented. In SACLA XFEL beamline, a high-resolution single-shot spectrometer (*), a timing monitor between XFEL beams and optical laser pulses (**), etc. have been developed and utilized for user experiments. The resolution of the spectrometer was confirmed to be 14 meV and a spectral spike of ~ 100 meV width was measured. The XFEL pulse duration was estimated to be 4.5 - 31 fs from this spectrometer depending on the bunch compression condition (*). The time jitter between an XFEL and an optical laser was appropriately measured to be ~ 100 fs STD by using the timing monitor (**). The design and performance of other beamline instruments will be also presented.
*) Y. Inubushi, et al., Physical Review Letters 109, 144801 (2012) **) T. Sato, et al., Proceedings of SRI 2012, THIC02 (2012) |
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Slides TUIBNO01 [5.870 MB] | |