European XFEL GmbH, Hamburg
The European XFEL will provide up to 2700 X-ray pulses during 600 microsecond long pulse trains with a repetition rate of 10 Hz. This leads to a short time heat load of FEL radiation of more than 10 kW in a sub-mm spot on the optical elements averaged over a pulse train and a less collimated high energy spontaneous radiation of similar magnitude. On the other hand, the conservation of coherence properties requires a stability of X-ray optics on the nanometer scale. Cooling concepts for mirrors and monochromators as well as photon damage aspects will be discussed. The conceptual design of photon beamlines and photon distribution schemes to different experimental stations will be presented.
ANL, Argonne
European XFEL GmbH, Hamburg
Free-electron lasers for hard x-rays can be constructed in oscillator (XFELO) configuration, providing ultra-high spectral purity and brightness [1]. The average brightness is expected to be several orders of magnitude higher than, and peak brightness comparable to that of SASE XFELs. XFELOs can enable revolutionary scientific opportunities as well as drastically improve experimental techniques developed at third-generation x-ray facilities. Low-loss x-ray crystal cavity and ultra-low-emittance electron beams are two major technical challenges in the realization of XFELOs. The requirements to x-ray cavity components are demanding: diamond crystals and curved grazing incidence mirrors must have near-perfect reflectivity, negligible wave-front distortions, and are subject to very tight tolerances on angular, spatial, and thermal stability under high heat load of the XFELO radiation. This paper gives an overview on the recent progress [2-4] and future plans in the R&D on the feasibility of x-ray cavities for XFELOs. The experimental and simulation studies results provide strong evidence for the feasibility of the x-ray cavities.
1. K-J. Kim, et al, PRL 100 (2008) 244802
2. Yu. Shvyd'ko, et al, Nature Phys. 6 (2010) 196
3. S. Stoupin, Yu. Shvyd'ko, PRL 104 (2010) 085901
4. S. Stoupin et al, Rev. Sci. Instr. 81 (2010) 055108