ERL2011 - List of Authors (Otake, Y.)

Paper

Title

Page

Design and Performance of the Synchronization System and Beam Diagnostic Instruments for SACLA

110

H. Maesaka, H. Ego, C. Kondo, T. Ohshima, Y. Otake, T. Sakurai
RIKEN SPring-8 Center, Sayo-cho, Sayo-gun, Hyogo, Japan
N. Hosoda, S. Matsubara, K. Yanagida
JASRI/SPring-8, Hyogo-ken, Japan
S.I. Inoue
SES, Hyogo-pref., Japan

In the XFEL facility "SACLA", the bunch length of an electron beam is compressed into 30 fs in order to obtain a demanded peak current of 3kA, and the normalized slice-emittance is required to be less than 1 um rad for stable lasing. Furthermore, an electron beam must be overlapped with radiated x-rays within 4 um in the undulator section. Therefore, we developed and constructed a precise synchronization system and high-resolution beam diagnostic instruments. For the synchronization, we employed a low-noise master oscillator, an optical rf distribution system, IQ (In-phase and Quadrature) modulators/demodulators etc. In order to reduce a thermal drift and electrical noise, these electronics are enclosed in a temperature-stabilized 19-inch rack and powered by a low-noise DC power supply. For the beam diagnostics, we developed a sub-um resolution rf cavity beam position monitor, a few-um resolution beam profile monitor, a C-band transverse rf deflecting structure for a 10-fs resolution temporal bunch structure measurement, etc. We confirmed the performance of these instruments by using an electron beam and finally achieved XFEL lasing in the wavelength region from 0.08 nm to 0.16 nm.

Slides WG4001 [5.169 MB]

Paper	Title	Page
WG4001	Design and Performance of the Synchronization System and Beam Diagnostic Instruments for SACLA	110
	H. Maesaka, H. Ego, C. Kondo, T. Ohshima, Y. Otake, T. Sakurai RIKEN SPring-8 Center, Sayo-cho, Sayo-gun, Hyogo, Japan N. Hosoda, S. Matsubara, K. Yanagida JASRI/SPring-8, Hyogo-ken, Japan S.I. Inoue SES, Hyogo-pref., Japan
	In the XFEL facility "SACLA", the bunch length of an electron beam is compressed into 30 fs in order to obtain a demanded peak current of 3kA, and the normalized slice-emittance is required to be less than 1 um rad for stable lasing. Furthermore, an electron beam must be overlapped with radiated x-rays within 4 um in the undulator section. Therefore, we developed and constructed a precise synchronization system and high-resolution beam diagnostic instruments. For the synchronization, we employed a low-noise master oscillator, an optical rf distribution system, IQ (In-phase and Quadrature) modulators/demodulators etc. In order to reduce a thermal drift and electrical noise, these electronics are enclosed in a temperature-stabilized 19-inch rack and powered by a low-noise DC power supply. For the beam diagnostics, we developed a sub-um resolution rf cavity beam position monitor, a few-um resolution beam profile monitor, a C-band transverse rf deflecting structure for a 10-fs resolution temporal bunch structure measurement, etc. We confirmed the performance of these instruments by using an electron beam and finally achieved XFEL lasing in the wavelength region from 0.08 nm to 0.16 nm.
	Slides WG4001 [5.169 MB]