Paper | Title | Other Keywords | Page |
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MOPD16 | Advanced Digital Signal Processing for Effective Beam Position Monitoring | synchrotron, antiproton, monitoring, proton | 74 |
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A latest experience in digital signal processing of BPM data obtained in synchrotrons of ITEP and GSI is discussed. The data in ITEP was collected by BPM processor prototype while the SIS18 in GSI uses a renovated digital system. Due to different concept of BPM architectures on those facilities it is possible to compare algorithms oriented to certain hardware. Several algorithms of position detection are compared to each other. Performances of ‘collective’ and partly distributed algorithms are estimated. Data reduction methods and visualization solutions are considered. Finally low- and wideband data evaluation for longitudinal phase space is presented. | |||
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Poster MOPD16 [13.416 MB] | ||
MOPD53 | Scintillation Screen Investigations for High Energy Heavy Ion Beams at GSI | ion, radiation, target, background | 170 |
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Funding: Funded by the German Ministry of Science (BMBF) under contract No. 06DA9026 Various scintillation screens were irradiated with high energy ion beams as extracted from the GSI synchrotron SIS18. Their imaging properties were studied with the goal to achieve a precise transverse profile determination. Scintillation images were characterized with respect to the light yield and statistical moments of the light distribution i.e. imaged beam width and shape. To study the scintillation properties over a wide range of intensities a 300 MeV/u Uranium ion beam with 104 to 109 particles per pulse was applied. Sensitive scintillators, namely CsI:Tl, YAG:Ce, P43 and Ce-doped glass were investigated for lower beam currents. Ceramics like Al2O3, Al2O3:Cr, ZrO2:Y and ZrO2:Mg as well as Herasil-glass were studied up to the maximum beam currents. For the various screens remarkable differences have been observed, e.g. the recorded profile width varies by nearly a factor of two. The obtained results serve as a basis for an appropriate choice of scintillator materials, which have to cope with the diversity of ion species and intensities at FAIR. |
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Poster MOPD53 [1.897 MB] | ||
MOPD60 | Beam Induced Fluorescence (BIF) Monitors as a Standard Operating Tool | controls, ion, photon, diagnostics | 185 |
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For high current operation at the GSI Heavy Ion UNILAC non intercepting methods for transverse beam profile determination are required. The Beam Induced Fluorescence (BIF) Monitor, an optical measurement device based on the observation of fluorescent light emitted by excited gas molecules was brought to routine operation. Detailed investigations were conducted for various beam parameters to improve the electronics and the optical setup. Up to now, four BIF monitor stations (for detection of both, horizontal and vertical beam profiles) were installed at UNILAC and two additional setups are planned. This contribution reports on first upgrades of the BIF monitors with a Siemens PLC for FESA-based slow controls and hardware protection procedures. The versatile control and display software ProfileView is presented as an easy-to-use and stable beam diagnostic tool for the GSI operating team. | |||
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Poster MOPD60 [3.060 MB] | ||