Keyword: background
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MOPD43 Beam Loss Detected by Scintillation Monitor hadron, linac, simulation, quadrupole 149
 
  • A. Miura, T. Maruta
    JAEA/J-PARC, Tokai-mura, Japan
  • K. Hasegawa, N. Ouchi, H. Sako
    JAEA, Ibaraki-ken, Japan
  • Z. Igarashi, M. Ikegami, T. Miyao
    KEK, Ibaraki, Japan
 
  Ar gas proportional BLMs have measured the beam loss through operations, but they are also sensitive to background noise of X-ray emitted from RF cavities. We have tried to measure the beam loss using scintillation monitors which would bring more accurate beam loss measurements with suppression of X-ray noise. We measured beam loss using scintillation beam loss monitors. Because this scintillation BLM is sensitive for low energy gamma-rays and fast neutrons, small signals from X-rays would be also detected. As the measurement results, a good signal to noise ratio is observed for the scintillation monitor with quite low sensitivity to the background X-ray. And many single events are observed in the intermediate pulse bunch with about 600 ns as pulse width. After all signals passed through the filter circuit and integrated circuit, total amount of X-ray noise can become smaller. We obtained the good performances of scintillation BLM with small effect of X-ray noise. This monitor can be used for beam loss measurement and a knob for tuning. Furthermore, because the detail structure can be detected, this monitor could be employed for another diagnostic device.  
 
MOPD53 Scintillation Screen Investigations for High Energy Heavy Ion Beams at GSI ion, heavy-ion, radiation, target 170
 
  • P. Forck, C.A. Andre, F. Becker, R. Haseitl, A. Reiter, B. Walasek-Höhne
    GSI, Darmstadt, Germany
  • W. Ensinger, K. Renuka
    TU Darmstadt, Darmstadt, Germany
 
  Funding: Funded by the German Ministry of Science (BMBF) under contract No. 06DA9026
Various scintillation screens were irradiated with high energy ion beams as extracted from the GSI synchrotron SIS18. Their imaging properties were studied with the goal to achieve a precise transverse profile determination. Scintillation images were characterized with respect to the light yield and statistical moments of the light distribution i.e. imaged beam width and shape. To study the scintillation properties over a wide range of intensities a 300 MeV/u Uranium ion beam with 104 to 109 particles per pulse was applied. Sensitive scintillators, namely CsI:Tl, YAG:Ce, P43 and Ce-doped glass were investigated for lower beam currents. Ceramics like Al2O3, Al2O3:Cr, ZrO2:Y and ZrO2:Mg as well as Herasil-glass were studied up to the maximum beam currents. For the various screens remarkable differences have been observed, e.g. the recorded profile width varies by nearly a factor of two. The obtained results serve as a basis for an appropriate choice of scintillator materials, which have to cope with the diversity of ion species and intensities at FAIR.
 
poster icon Poster MOPD53 [1.897 MB]  
 
TUPD42 Design and Experiences with the Beam Condition Monitor as Protection System in the CMS Experiment of the LHC vacuum, monitoring, beam-losses, radiation 398
 
  • M. Guthoff
    CERN, Geneva, Switzerland
 
  The Beam Condition Monitor (BCM) is used as protection system. In order to prevent damage to the pixel and tracker detectors it can trigger a beam dump when extremely high beam losses occur. The system consists of BCM1L with 4 diamonds per side at 1.8m away from the interaction point and BCM2 with 4 inner and 8 outer diamonds per side at 14.4m away from the interaction point. As detector material poly-crystalline CVD diamonds are used. The readout electronics is identical to the Beam Loss Monitor (BLM) system of the LHC. With cross calibration measurements a direct comparison between the BLM and the BCM systems is possible. The BCM system is therefore a transparent extension of the BLM system into the CMS cavern. The BCM2 system has been active in the beam abort system since the beginning of collisions at the LHC. Design and performance of the system during the run of the LHC so far will be presented.
*on behalf of the CMS BRM group.
 
poster icon Poster TUPD42 [0.736 MB]  
 
TUPD56 High Resolution SR Profile Monitor at ATF2 Extraction Line extraction, emittance, controls, damping 434
 
  • T. Naito, T.M. Mitsuhashi
    KEK, Ibaraki, Japan
 
  The profile monitor using visible light of the SR at ATF2 extraction line has been developed. KEK-ATF is a facility to produce extremely low emittance beam for the linear collider. The emittance in the damping ring is ex=1x10-9 m and ey=1x10{-11} m, respectively. The ATF2 extraction line is a transport line to study the Final focus system for the linear collider. The designed beam size at the profile monitor is 230 μm in horizontal and 13 μm in vertical. We used a wide aperture optical system to reduce the Rayleigh limit of the optical system. The performance of the monitor is reported.  
 
TUPD65 Four-Dimensional Transverse Emittance Measurement Unit for High Intensity Ion Beams emittance, ion, rfq, vacuum 455
 
  • S.X. Peng, J.E. Chen, Z.Y. Guo, P.N. Lu, Y.R. Lu, Z.X. Yuan, J. Zhao
    PKU/IHIP, Beijing, People's Republic of China
  • H.T. Ren
    Graduate University, Chinese Academy of Sciences, Beijing, People's Republic of China
 
  Funding: National Natural Science Foundation of China
An X-Y coplaner High Intensity Beam Emittance Measurement Unit named as HIBEMU-4 has been developed recently to measure the emmitance of 2 MeV/40mA D+ beam at the RFQ exit of PeKing University Neutron Imaging FaciliTY (PKUNIFTY). HIBEMU-4 is based on the slit-wire method, and has two groups of slits in the orthogonal directions. Equipped with user-oriented software, it is able to provide results as root-mean-square(rms) emittance, boundary emittance, Twiss-parameters and phase diagram. In this paper we will mainly discuss the strengths and limitations of HIBEMU-4 at the aspects of mechanical designing and data processing method. In addition the testing of HIBEMU-4 on 1MeV O+ beam as well as 2 MeV/40mA D+ is closely presented, which shows HIBEMU-4 is competent in high intensity beam (HIB) emmitance measurements.