BIW2012 - List of Authors (Stalder, M.)

Paper

Title

Page

A New System for Monitoring Transverse Beam Profiles

15

L. Panitzsch, S. Böttcher, M. Stalder, R.F. Wimmer-Schweingruber
IEAP, Kiel, Germany

To accurately and rapidly measure transverse beam profiles of charged particles beams (i.e. ions or electrons), we have developed a robust detector based on an array of tiny Faraday cups (FC, Ø = 0.3mm). Its robust design allows the detector to withstand continuous heat loads of about 40W using radiative cooling. In contrast to other monitoring systems effectively no wearing parts are used extending the lifetime of our detector enormously. The profiles are directly acquired in units of total current per area preventing the need of inversion calculations. Biased repellers suppress secondary electron escape. The spatial resolution (22×20 measurements/cm²) enables the detection of structures on millimetre scales. This space-optimized detector system is driven through the beam to acquire the data and does not interfere with the beam when not in operation. One complete scan takes roughly 5s. The electrical dynamic range can be adjusted upon demand. Additionally, a detector-integrated large FC enables measuring the total beam current. We will present this detector in detail and demonstrate its performance by showing measured beam profiles.

Slides MOCP03 [17.711 MB]

Paper	Title	Page
MOCP03	A New System for Monitoring Transverse Beam Profiles	15
	L. Panitzsch, S. Böttcher, M. Stalder, R.F. Wimmer-Schweingruber IEAP, Kiel, Germany
	To accurately and rapidly measure transverse beam profiles of charged particles beams (i.e. ions or electrons), we have developed a robust detector based on an array of tiny Faraday cups (FC, Ø = 0.3mm). Its robust design allows the detector to withstand continuous heat loads of about 40W using radiative cooling. In contrast to other monitoring systems effectively no wearing parts are used extending the lifetime of our detector enormously. The profiles are directly acquired in units of total current per area preventing the need of inversion calculations. Biased repellers suppress secondary electron escape. The spatial resolution (22×20 measurements/cm²) enables the detection of structures on millimetre scales. This space-optimized detector system is driven through the beam to acquire the data and does not interfere with the beam when not in operation. One complete scan takes roughly 5s. The electrical dynamic range can be adjusted upon demand. Additionally, a detector-integrated large FC enables measuring the total beam current. We will present this detector in detail and demonstrate its performance by showing measured beam profiles.
	Slides MOCP03 [17.711 MB]