BIW2012 - List of Authors (Pikin, A.I.)

Paper

Title

Page

RHIC Electron-Lens Beam Profile Monitoring

213

T.A. Miller, J.N. Aronson, D.M. Gassner, A.I. Pikin
BNL, Upton, Long Island, New York, USA

In preparation for installation of an Electron Lens (E-Lens) into RHIC, planned for the summer of 2012, a test bench is being set up to allow the electron gun and collector assemblies, destined for the final E-Lens installation, to be tested together with a downsized mid-drift section. The goal of this effort is to test the electron gun and the collector designs, as well as the beam profiling instrumentation. A small unbiased Faraday cup, equipped with a grounded pin-hole mask, will intercept the beam; while an automated Control and data acquisition system will raster scan the electron beam across the detector. The collected integrated charge measurement is digitized and stored in an image type data file. This remote controlled plunging detector can be alternatively located in the same position as a plunging YAG:Ce crystal. A viewing port at the downstream extremity of the collector allows a GigE camera, fitted with a custom zoom lens, to image the crystal and digitize the profile of a beam pulse. Custom beam imaging software has been written to import both beam image files (pin-hole and YAG) and fully characterize the image of the beam profile.

Poster TUPG039 [30.885 MB]

MOPG025

Design of a Proton-Electron Beam Overlap Monitor for the New RHIC Electron Lens based on Detecting Energetic Backscattered Electrons

86

P. Thieberger, E.N. Beebe, W. Fischer, D.M. Gassner, X. Gu, K. Hamdi, J. Hock, T.A. Miller, M.G. Minty, C. Montag, A.I. Pikin
BNL, Upton, Long Island, New York, USA

Funding: Work supported by Brookhaven Science Associates, LLC under contract No. DE-AC02-98CH10886 with the U.S. Department of Energy.
The optimal performance of the two electron lenses that are being implemented for high intensity polarized proton operation of RHIC requires excellent collinearity of the ~0.3 mm RMS wide electron beams with the proton bunch trajectories over the ~2m interaction lengths. The main beam overlap diagnostic tool will make use of electrons backscattered in close encounters with the relativistic protons. These electrons will spiral along the electron guiding magnetic field and will be detected in a plastic scintillator located close to the electron gun. A fraction of these electrons will have energies high enough to emerge from the vacuum chamber through a thin window thus simplifying the design and operation of the detector. The intensity of the detected electrons provides a measure of the overlap between the e^- and the opposing proton beams. Joint electron arrival time and energy discrimination may be used additionally to gain some longitudinal position information with a single detector per lens.

Poster MOPG025 [0.793 MB]

Paper	Title	Page
TUPG039	RHIC Electron-Lens Beam Profile Monitoring	213
	T.A. Miller, J.N. Aronson, D.M. Gassner, A.I. Pikin BNL, Upton, Long Island, New York, USA
	In preparation for installation of an Electron Lens (E-Lens) into RHIC, planned for the summer of 2012, a test bench is being set up to allow the electron gun and collector assemblies, destined for the final E-Lens installation, to be tested together with a downsized mid-drift section. The goal of this effort is to test the electron gun and the collector designs, as well as the beam profiling instrumentation. A small unbiased Faraday cup, equipped with a grounded pin-hole mask, will intercept the beam; while an automated Control and data acquisition system will raster scan the electron beam across the detector. The collected integrated charge measurement is digitized and stored in an image type data file. This remote controlled plunging detector can be alternatively located in the same position as a plunging YAG:Ce crystal. A viewing port at the downstream extremity of the collector allows a GigE camera, fitted with a custom zoom lens, to image the crystal and digitize the profile of a beam pulse. Custom beam imaging software has been written to import both beam image files (pin-hole and YAG) and fully characterize the image of the beam profile.
	Poster TUPG039 [30.885 MB]

MOPG025	Design of a Proton-Electron Beam Overlap Monitor for the New RHIC Electron Lens based on Detecting Energetic Backscattered Electrons	86
	P. Thieberger, E.N. Beebe, W. Fischer, D.M. Gassner, X. Gu, K. Hamdi, J. Hock, T.A. Miller, M.G. Minty, C. Montag, A.I. Pikin BNL, Upton, Long Island, New York, USA
	Funding: Work supported by Brookhaven Science Associates, LLC under contract No. DE-AC02-98CH10886 with the U.S. Department of Energy. The optimal performance of the two electron lenses that are being implemented for high intensity polarized proton operation of RHIC requires excellent collinearity of the ~0.3 mm RMS wide electron beams with the proton bunch trajectories over the ~2m interaction lengths. The main beam overlap diagnostic tool will make use of electrons backscattered in close encounters with the relativistic protons. These electrons will spiral along the electron guiding magnetic field and will be detected in a plastic scintillator located close to the electron gun. A fraction of these electrons will have energies high enough to emerge from the vacuum chamber through a thin window thus simplifying the design and operation of the detector. The intensity of the detected electrons provides a measure of the overlap between the e^- and the opposing proton beams. Joint electron arrival time and energy discrimination may be used additionally to gain some longitudinal position information with a single detector per lens.
	Poster MOPG025 [0.793 MB]