BIW2012 - List of Authors (Aronson, J.N.)

Paper

Title

Page

RHIC Electron-Lens Beam Profile Monitoring

213

T.A. Miller, J.N. Aronson, D.M. Gassner, A.I. Pikin
BNL, Upton, Long Island, New York, USA

In preparation for installation of an Electron Lens (E-Lens) into RHIC, planned for the summer of 2012, a test bench is being set up to allow the electron gun and collector assemblies, destined for the final E-Lens installation, to be tested together with a downsized mid-drift section. The goal of this effort is to test the electron gun and the collector designs, as well as the beam profiling instrumentation. A small unbiased Faraday cup, equipped with a grounded pin-hole mask, will intercept the beam; while an automated Control and data acquisition system will raster scan the electron beam across the detector. The collected integrated charge measurement is digitized and stored in an image type data file. This remote controlled plunging detector can be alternatively located in the same position as a plunging YAG:Ce crystal. A viewing port at the downstream extremity of the collector allows a GigE camera, fitted with a custom zoom lens, to image the crystal and digitize the profile of a beam pulse. Custom beam imaging software has been written to import both beam image files (pin-hole and YAG) and fully characterize the image of the beam profile.

Poster TUPG039 [30.885 MB]

Paper	Title	Page
TUPG039	RHIC Electron-Lens Beam Profile Monitoring	213
	T.A. Miller, J.N. Aronson, D.M. Gassner, A.I. Pikin BNL, Upton, Long Island, New York, USA
	In preparation for installation of an Electron Lens (E-Lens) into RHIC, planned for the summer of 2012, a test bench is being set up to allow the electron gun and collector assemblies, destined for the final E-Lens installation, to be tested together with a downsized mid-drift section. The goal of this effort is to test the electron gun and the collector designs, as well as the beam profiling instrumentation. A small unbiased Faraday cup, equipped with a grounded pin-hole mask, will intercept the beam; while an automated Control and data acquisition system will raster scan the electron beam across the detector. The collected integrated charge measurement is digitized and stored in an image type data file. This remote controlled plunging detector can be alternatively located in the same position as a plunging YAG:Ce crystal. A viewing port at the downstream extremity of the collector allows a GigE camera, fitted with a custom zoom lens, to image the crystal and digitize the profile of a beam pulse. Custom beam imaging software has been written to import both beam image files (pin-hole and YAG) and fully characterize the image of the beam profile.
	Poster TUPG039 [30.885 MB]