NAPAC2019 - List of Authors (Song, Y.)

Paper	Title	Page
MOPLS08	Error Tolerance Characterization for the HUST MeV Ultrafast Electron Diffraction System	166
	Y. Song, K. Fan, C.-Y. Tsai HUST, Wuhan, People’s Republic of China
	Ultrafast electron diffraction (UED) is a powerful tool for probing atomic dynamics with a femtosecond resolution. Such a spatiotemporal resolution requires error tolerance for the UED system which includes the RF system, the laser system, the beamline elements, etc. To characterize the error tolerance of the required spatiotemporal resolution for the 1.4-cell MeV UED we are developing, we use ASTRA to simulate the UED model with errors including initial transverse beam centroid offset, RF amplitude jitter and injection phase jitter, etc. By performing simulations with different errors omitted, we can characterize the contribution of each error and thus set the tolerance for each error to obtain the required performance of UED experiment. In the end, we present the error tolerance for 10% emittance growth and 100 fs time of flight variation to maintain the required spatiotemporal resolution.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-NAPAC2019-MOPLS08
About •	paper received ※ 25 August 2019 paper accepted ※ 31 August 2019 issue date ※ 08 October 2019
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

Error Tolerance Characterization for the HUST MeV Ultrafast Electron Diffraction System

166

Y. Song, K. Fan, C.-Y. Tsai
HUST, Wuhan, People’s Republic of China

Ultrafast electron diffraction (UED) is a powerful tool for probing atomic dynamics with a femtosecond resolution. Such a spatiotemporal resolution requires error tolerance for the UED system which includes the RF system, the laser system, the beamline elements, etc. To characterize the error tolerance of the required spatiotemporal resolution for the 1.4-cell MeV UED we are developing, we use ASTRA to simulate the UED model with errors including initial transverse beam centroid offset, RF amplitude jitter and injection phase jitter, etc. By performing simulations with different errors omitted, we can characterize the contribution of each error and thus set the tolerance for each error to obtain the required performance of UED experiment. In the end, we present the error tolerance for 10% emittance growth and 100 fs time of flight variation to maintain the required spatiotemporal resolution.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-NAPAC2019-MOPLS08

About •

paper received ※ 25 August 2019 paper accepted ※ 31 August 2019 issue date ※ 08 October 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)