Paper | Title | Page |
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THPMK031 | Elliptically Polarizing Undulator Design for PAL-XFEL | 4362 |
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Funding: This research was supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science and ICT (2017R1C1B1012852). Elliptically polarizing undulator (EPU) is under consideration as after-burner for the PAL-XFEL soft X-ray beamline to control the FEL polarization. In the soft X-ray line, seven planar undulators with a 35 mm period and 5 m length are in operation. To provide a polarization control of the FEL in the 1 to 3 nm wavelength, we compare the two types of EPUs, APPLE-II, and APPLE-X. The K value ranges for various operation modes are numerically studied for two undulator periods, 35 and 40 mm, of these EPU types. |
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DOI • | reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2018-THPMK031 | |
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THPMK032 | RADFET Installation at PAL-XFEL Undulator | 4366 |
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Two undulator beamlines, one hard X-ray and one soft X-ray, are in operation at PAL-XFEL. Radiation produced during the FEL operation may impair the magnetic property of the undulator magnets and affect the FEL performance. Accumulated radiation at the undulator sections is being measured by using optically stimulated luminescent dosimeters (OSLDs) once per few months. Over 10 Gy gamma ray was detected at some locations at both undulator beamlines. However, in the measurement using the OSLDs we do not have information on which accelerator operation modes produce such high level of radiation on the undulators. To measure accumulated radiation in real time, we installed radiation-sensing field-effect transistors (RADFETs). We report the characteristics of the RADFET sensors and the installation at the PAL-XFEL undulator beamlines. | ||
DOI • | reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2018-THPMK032 | |
Export • | reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml) | |