IBIC2019 - Table of Session: THAO (Novel Techniques and Technologies)

Paper	Title	Page
THAO01	Cherenkov Diffraction Radiation as a tool for beam diagnostics	660
	T. Lefèvre, D. Alves, M. Bergamaschi, A. Curcio, O.R. Jones, R. Kieffer, S. Mazzoni, N. Mounet, A. Schlogelhofer, E. Senes CERN, Meyrin, Switzerland M. Apollonio, L. Bobb DLS, Oxfordshire, United Kingdom A. Aryshev, N. Terunuma KEK, Ibaraki, Japan M.G. Billing, Y.L. Bordlemay Padilla, J.V. Conway, J.P. Shanks Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA V.V. Bleko, S.Yu. Gogolev, A.S. Konkov, J.S. Markova, A. Potylitsyn, D.A. Shkitov TPU, Tomsk, Russia K.V. Fedorov, D.M. Harryman, P. Karataev, K. Lekomtsev JAI, Egham, Surrey, United Kingdom J. Gardelle CEA, LE BARP cedex, France K. Łasocha Jagiellonian University, Kraków, Poland
	During the last three years, the emission of Cherenkov Diffraction Radiation (ChDR), appearing when a relativistic charged particle moves in the vicinity of a dielectric medium, has been investigated with the aim of providing non-invasive beam diagnostics. ChDR has very interesting properties, with a large number of photons emitted in a narrow and well-defined solid angle, providing excellent conditions for detection with very little background. This contribution will present a collection of recent beam measurements performed at several facilities such as the Cornell Electron Storage Ring, the Advanced Test Facility 2 at KEK, the Diamond light source in the UK and the CLEAR test facility at CERN. Those results, complemented with simulations, suggest that the use of both incoherent and coherent emission of Cherenkov diffraction radiation could open up new beam instrumentation possibilities for relativistic charged particle beams.
	Slides THAO01 [10.658 MB]
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-THAO01
About •	paper received ※ 09 September 2019 paper accepted ※ 10 September 2019 issue date ※ 10 November 2019
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THAO02	Towards Full Silicon 4H-SiC Based X-Ray Beam Monitoring	665
	M. Camarda, M. Birri, M. Carullapresenter, D. Grolimund, B. Meyer, C. Pradervand PSI, Villigen PSI, Switzerland U. Grossner, S.M. Nida, A. Tsibizov, T. Ziemann ETH, Zurich, Switzerland
	In this work, we present extensive theoretical and experimental results of novel Silicon Carbide x-ray sensors for beam position monitoring (XBPM). Until recently, diamond, was considered the material-of-choice for continuous monitoring of hard (>6keV) x-ray beams at synchrotron light sources. Diamond XBPM are now commercially available as single crystal* and polycrystalline sensors. However, in a recently published paper, we have shown that Silicon Carbide is superior to both diamond crystal types in several critical aspects. Specifically, we found superior electrical characteristics (sensor dynamics, signal uniformity, signal strength) and superior optical properties (full device transparency, device active area, signal strength) when compared to commercial polycrystalline and single crystal diamond, respectively. We also succeeded in the ¿industrialization¿ of the SiC fabrication process, allowing for the simultaneous realization of several (>40) sensors in up to 4¿ SiC wafers, with high yields. More recently we have also analyzed the fluorescence of SiC sensors as compared to YAG ones, finding that SiC can also be used for hybrid position/shape monitoring schema. CIVIDEC. AT, SYDORTECHNOLOGIES. COM DECTRIS. COM * S. Nida, et. al. Silicon carbide X-ray beam position monitors for synchrotron applications J. Synchrotron Rad. 26, 28-35 (2019)
	Slides THAO02 [9.963 MB]
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-THAO02
About •	paper received ※ 11 September 2019 paper accepted ※ 11 September 2019 issue date ※ 10 November 2019
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

THAO03	ROSE - a Rotating 4D Emittance Scanner	669
	M.T. Maier, L. Groening, C. Xiao GSI, Darmstadt, Germany A. Bechtold NTG, Gelnhausen, Germany J.M. Maus NTG Neue Technologien GmbH & Co KG, Gelnhausen, Germany
	The detector system ROSE, allowing to perform 4D emittance measurements on heavy ion beams independent of their energy and time structure, has been built and successfully commissioned in 2016 at GSI in Darmstadt, Germany. This method to measure the four dimensional emittance has then been granted a patent in 2017. The inventors together with the technology transfer department of GSI have found an industrial partner to modify ROSE into a fully standalone, mobile emittance scanner system. This is a three step process involving the ROSE hardware, the electronics ROBOMAT and the software working packages. The electronics was commissioned at the ECR test bench of the Heidelberg ion therapy facility HIT in June 2019. Currently our main focus is on the development of the 4D software package ROSOFT. This contribution presents the actual status and introduces the multiple possibilities of this 4D emittance scanner.
	Slides THAO03 [26.411 MB]
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-THAO03
About •	paper received ※ 03 September 2019 paper accepted ※ 10 September 2019 issue date ※ 10 November 2019
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

THAO04	Transverse Emittance Measurement using Undulator High Harmonics for Diffraction Limited Storage Rings	674
	K.P. Wootton, J.L. McChesney, F.M. Rodolakis, N. Sereno, B.X. Yang ANL, Lemont, Illinois, USA
	Funding: This research used resources of the Advanced Photon Source, operated for the U.S Department of Energy Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357. A particular challenge for diagnostics in diffraction limited storage ring light sources is the measurement of electron beam transverse emittances. In the present work, we present measurements and simulations of vertical electron beam emittance using high harmonics from an electromagnetic undulator in the present Advanced Photon Source storage ring. Based on these results, using simulation we motivate an undulator-based horizontal and vertical transverse emittance monitor for diffraction limited storage rings, using the Advanced Photon Source Upgrade as an example.
	Slides THAO04 [2.655 MB]
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-THAO04
About •	paper received ※ 04 September 2019 paper accepted ※ 10 September 2019 issue date ※ 10 November 2019
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

Cherenkov Diffraction Radiation as a tool for beam diagnostics

660

T. Lefèvre, D. Alves, M. Bergamaschi, A. Curcio, O.R. Jones, R. Kieffer, S. Mazzoni, N. Mounet, A. Schlogelhofer, E. Senes
CERN, Meyrin, Switzerland
M. Apollonio, L. Bobb
DLS, Oxfordshire, United Kingdom
A. Aryshev, N. Terunuma
KEK, Ibaraki, Japan
M.G. Billing, Y.L. Bordlemay Padilla, J.V. Conway, J.P. Shanks
Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
V.V. Bleko, S.Yu. Gogolev, A.S. Konkov, J.S. Markova, A. Potylitsyn, D.A. Shkitov
TPU, Tomsk, Russia
K.V. Fedorov, D.M. Harryman, P. Karataev, K. Lekomtsev
JAI, Egham, Surrey, United Kingdom
J. Gardelle
CEA, LE BARP cedex, France
K. Łasocha
Jagiellonian University, Kraków, Poland

During the last three years, the emission of Cherenkov Diffraction Radiation (ChDR), appearing when a relativistic charged particle moves in the vicinity of a dielectric medium, has been investigated with the aim of providing non-invasive beam diagnostics. ChDR has very interesting properties, with a large number of photons emitted in a narrow and well-defined solid angle, providing excellent conditions for detection with very little background. This contribution will present a collection of recent beam measurements performed at several facilities such as the Cornell Electron Storage Ring, the Advanced Test Facility 2 at KEK, the Diamond light source in the UK and the CLEAR test facility at CERN. Those results, complemented with simulations, suggest that the use of both incoherent and coherent emission of Cherenkov diffraction radiation could open up new beam instrumentation possibilities for relativistic charged particle beams.

Slides THAO01 [10.658 MB]

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-THAO01

About •

paper received ※ 09 September 2019 paper accepted ※ 10 September 2019 issue date ※ 10 November 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

THAO02

Towards Full Silicon 4H-SiC Based X-Ray Beam Monitoring

665

M. Camarda, M. Birri, M. Carullapresenter, D. Grolimund, B. Meyer, C. Pradervand
PSI, Villigen PSI, Switzerland
U. Grossner, S.M. Nida, A. Tsibizov, T. Ziemann
ETH, Zurich, Switzerland

In this work, we present extensive theoretical and experimental results of novel Silicon Carbide x-ray sensors for beam position monitoring (XBPM). Until recently, diamond, was considered the material-of-choice for continuous monitoring of hard (>6keV) x-ray beams at synchrotron light sources. Diamond XBPM are now commercially available as single crystal* and polycrystalline** sensors. However, in a recently published paper***, we have shown that Silicon Carbide is superior to both diamond crystal types in several critical aspects. Specifically, we found superior electrical characteristics (sensor dynamics, signal uniformity, signal strength) and superior optical properties (full device transparency, device active area, signal strength) when compared to commercial polycrystalline and single crystal diamond, respectively. We also succeeded in the ¿industrialization¿ of the SiC fabrication process, allowing for the simultaneous realization of several (>40) sensors in up to 4¿ SiC wafers, with high yields. More recently we have also analyzed the fluorescence of SiC sensors as compared to YAG ones, finding that SiC can also be used for hybrid position/shape monitoring schema.
* CIVIDEC. AT, SYDORTECHNOLOGIES. COM
** DECTRIS. COM
*** S. Nida, et. al. Silicon carbide X-ray beam position monitors for synchrotron applications J. Synchrotron Rad. 26, 28-35 (2019)

Slides THAO02 [9.963 MB]

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-THAO02

About •

paper received ※ 11 September 2019 paper accepted ※ 11 September 2019 issue date ※ 10 November 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

THAO03

ROSE - a Rotating 4D Emittance Scanner

669

M.T. Maier, L. Groening, C. Xiao
GSI, Darmstadt, Germany
A. Bechtold
NTG, Gelnhausen, Germany
J.M. Maus
NTG Neue Technologien GmbH & Co KG, Gelnhausen, Germany

The detector system ROSE, allowing to perform 4D emittance measurements on heavy ion beams independent of their energy and time structure, has been built and successfully commissioned in 2016 at GSI in Darmstadt, Germany. This method to measure the four dimensional emittance has then been granted a patent in 2017. The inventors together with the technology transfer department of GSI have found an industrial partner to modify ROSE into a fully standalone, mobile emittance scanner system. This is a three step process involving the ROSE hardware, the electronics ROBOMAT and the software working packages. The electronics was commissioned at the ECR test bench of the Heidelberg ion therapy facility HIT in June 2019. Currently our main focus is on the development of the 4D software package ROSOFT. This contribution presents the actual status and introduces the multiple possibilities of this 4D emittance scanner.

Slides THAO03 [26.411 MB]

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-THAO03

About •

paper received ※ 03 September 2019 paper accepted ※ 10 September 2019 issue date ※ 10 November 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

THAO04

Transverse Emittance Measurement using Undulator High Harmonics for Diffraction Limited Storage Rings

674

K.P. Wootton, J.L. McChesney, F.M. Rodolakis, N. Sereno, B.X. Yang
ANL, Lemont, Illinois, USA

Funding: This research used resources of the Advanced Photon Source, operated for the U.S Department of Energy Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357.
A particular challenge for diagnostics in diffraction limited storage ring light sources is the measurement of electron beam transverse emittances. In the present work, we present measurements and simulations of vertical electron beam emittance using high harmonics from an electromagnetic undulator in the present Advanced Photon Source storage ring. Based on these results, using simulation we motivate an undulator-based horizontal and vertical transverse emittance monitor for diffraction limited storage rings, using the Advanced Photon Source Upgrade as an example.

Slides THAO04 [2.655 MB]

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-THAO04

About •

paper received ※ 04 September 2019 paper accepted ※ 10 September 2019 issue date ※ 10 November 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)