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RIS citation export for TUPFDV004: A SIMS Approach for the Analysis of Furnace Contamination

TY  - CONF
AU  - Angle, J.W.
AU  - Kelley, M.J.
AU  - Lechner, E.M.
AU  - Palczewski, A.D.
AU  - Reece, C.E.
AU  - Stevie, F.A.
ED  - Saito, Kenji
ED  - Xu, Ting
ED  - Sakamoto, Naruhiko
ED  - Lesage, Ana
ED  - Schaa, Volker R.W.
TI  - A SIMS Approach for the Analysis of Furnace Contamination
J2  - Proc. of SRF2021, East Lansing, MI, USA, 28 June-02 July 2021
CY  - East Lansing, MI, USA
T2  - International Conference on RF Superconductivity
T3  - 20
LA  - english
AB  - Detection of surface contamination for SRF material is difficult due to the miniscule quantities and near atomic resolution needed. Visual inspection of samples known to have experienced surface contamination were found to have inconsistent nitride coverage after nitrogen doping. EBSD analysis suggest that nitride suppression tends to be most prevalent when deviating from the [111] and [001] zone axes. XPS suggested that tin was present as a contaminant on the surface with SIMS mass spectra also confirming its presence. SIMS depth profiles show a depletion of nitrogen content as well as an increase in car-bon content for contaminated samples.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 406
EP  - 410
KW  - cavity
KW  - niobium
KW  - SRF
KW  - survey
KW  - electron
DA  - 2022/10
PY  - 2022
SN  - 2673-5504
SN  - 978-3-95450-233-2
DO  - doi:10.18429/JACoW-SRF2021-TUPFDV004
UR  - https://jacow.org/srf2021/papers/tupfdv004.pdf
ER  -