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BiBTeX citation export for TUPFDV004: A SIMS Approach for the Analysis of Furnace Contamination

@inproceedings{angle:srf2021-tupfdv004,
  author       = {J.W. Angle and M.J. Kelley and E.M. Lechner and A.D. Palczewski and C.E. Reece and F.A. Stevie},
  title        = {{A SIMS Approach for the Analysis of Furnace Contamination}},
  booktitle    = {Proc. SRF'21},
% booktitle    = {Proc. 20th International Conference on RF Superconductivity (SRF'21)},
  pages        = {406--410},
  eid          = {TUPFDV004},
  language     = {english},
  keywords     = {cavity, niobium, SRF, survey, electron},
  venue        = {East Lansing, MI, USA},
  series       = {International Conference on RF Superconductivity},
  number       = {20},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {10},
  year         = {2022},
  issn         = {2673-5504},
  isbn         = {978-3-95450-233-2},
  doi          = {10.18429/JACoW-SRF2021-TUPFDV004},
  url          = {https://jacow.org/srf2021/papers/tupfdv004.pdf},
  abstract     = {{Detection of surface contamination for SRF material is difficult due to the miniscule quantities and near atomic resolution needed. Visual inspection of samples known to have experienced surface contamination were found to have inconsistent nitride coverage after nitrogen doping. EBSD analysis suggest that nitride suppression tends to be most prevalent when deviating from the [111] and [001] zone axes. XPS suggested that tin was present as a contaminant on the surface with SIMS mass spectra also confirming its presence. SIMS depth profiles show a depletion of nitrogen content as well as an increase in car-bon content for contaminated samples.}},
}