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BiBTeX citation export for TUOFDV05: Dynamics of RF Dissipation Probed via High-Speed Temperature Mapping

@inproceedings{porter:srf2021-tuofdv05,
  author       = {R.D. Porter and N. Banerjee and M. Liepe},
  title        = {{Dynamics of RF Dissipation Probed via High-Speed Temperature Mapping}},
  booktitle    = {Proc. SRF'21},
% booktitle    = {Proc. 20th International Conference on RF Superconductivity (SRF'21)},
  pages        = {349--356},
  eid          = {TUOFDV05},
  language     = {english},
  keywords     = {cavity, SRF, site, electron, data-acquisition},
  venue        = {East Lansing, MI, USA},
  series       = {International Conference on RF Superconductivity},
  number       = {20},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {10},
  year         = {2022},
  issn         = {2673-5504},
  isbn         = {978-3-95450-233-2},
  doi          = {10.18429/JACoW-SRF2021-TUOFDV05},
  url          = {https://jacow.org/srf2021/papers/tuofdv05.pdf},
  abstract     = {{Recently, Cornell University has developed a new high-speed, high-resolution temperature mapping system that can resolve the time dynamics of RF dissipation, i.e., provide high-speed videos of the surface heating across the entire surface of the cavity. This new powerful tool allows to observe rapid changes in the local RF dissipation, as well as to resolve the dynamics of quenches, field emission processing, and other cavity events, giving new insights into these. This contribution presents the development of this new high-speed temperature mapping system, discusses its commissioning and extensive performance testing (e.g., demonstrating micro-Kelvin resolution), as well as show intriguing high-speed temperature mapping results from multiple Nb₃Sn cavities.}},
}