JACoW is a publisher in Geneva, Switzerland that publishes the proceedings of accelerator conferences held around the world by an international collaboration of editors.
D.J. Seal et al., “A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate”, in Proc. SRF'21, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 100-104. doi:10.18429/JACoW-SRF2021-SUPFDV016