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BiBTeX citation export for SUPFDV006: Investigation of SIS Multilayer Films at HZB

@inproceedings{tikhonov:srf2021-supfdv006,
  author       = {D.B. Tikhonov and E. Chyhyrynets and S. Keckert and J. Knobloch and O. Kugeler and S.B. Leith and C. Pira and M. Vogel},
% author       = {D.B. Tikhonov and E. Chyhyrynets and S. Keckert and J. Knobloch and O. Kugeler and S.B. Leith and others},
% author       = {D.B. Tikhonov and others},
  title        = {{Investigation of SIS Multilayer Films at HZB}},
  booktitle    = {Proc. SRF'21},
% booktitle    = {Proc. 20th International Conference on RF Superconductivity (SRF'21)},
  pages        = {72--76},
  eid          = {SUPFDV006},
  language     = {english},
  keywords     = {SRF, superconductivity, cavity, radio-frequency, quadrupole},
  venue        = {East Lansing, MI, USA},
  series       = {International Conference on RF Superconductivity},
  number       = {20},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {10},
  year         = {2022},
  issn         = {2673-5504},
  isbn         = {978-3-95450-233-2},
  doi          = {10.18429/JACoW-SRF2021-SUPFDV006},
  url          = {https://jacow.org/srf2021/papers/supfdv006.pdf},
  abstract     = {{The systematic study of multilayer SIS films (Superconductor-Insulator-Superconductor) is being conducted in Helmholtz-Zentrum Berlin. Such films theoretically should boost the performance of superconducting cavities, and reduce some problems related to bulk Nb such as magnetic flux trapping. Up to now such films have been presented in theory, but the RF performance of those structures have not been widely studied. In this contribution we present the results of the latest tests of AlN-NbN films, deposited on micrometers-thick Nb layers on copper. It has, also, been shown previously at HZB that such SIS films may show some unexpected behavior in surface resistance versus temperature parameter space. In this contribution we continue to investigate those effects with the variation of different parameters of films (such as insulator thickness) and production recipes.}},
}