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BiBTeX citation export for MOPFDV001: Investigation of an Alternative Path for SRF Cavity Fabrication and Surface Processing

@inproceedings{hryhorenko:srf2021-mopfdv001,
  author       = {O. Hryhorenko and C.Z. Antoine and F. Brisset and T. Dohmae and D. Longuevergne},
  title        = {{Investigation of an Alternative Path for SRF Cavity Fabrication and Surface Processing}},
  booktitle    = {Proc. SRF'21},
% booktitle    = {Proc. 20th International Conference on RF Superconductivity (SRF'21)},
  pages        = {319--322},
  eid          = {MOPFDV001},
  language     = {english},
  keywords     = {SRF, cavity, niobium, laser, embedded},
  venue        = {East Lansing, MI, USA},
  series       = {International Conference on RF Superconductivity},
  number       = {20},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {10},
  year         = {2022},
  issn         = {2673-5504},
  isbn         = {978-3-95450-233-2},
  doi          = {10.18429/JACoW-SRF2021-MOPFDV001},
  url          = {https://jacow.org/srf2021/papers/mopfdv001.pdf},
  abstract     = {{The preparation of SRF cavities includes a lengthy, costly, and safety issued electrochemical polishing (EP or BCP) step to remove the damaged layer coming from the cavity fabrication. We have shown that most of the damage layer is originated from the rolling process during the preparation of the sheet material, while subsequent deep drawing tends to leave only µm thick damage layer. We propose a 2-steps mechanical process that allows us to easily get rid of the thick damage layer on the sheets before cavity forming. The process has been established on samples and extended to large disks ready for 1.3 GHz half-cell forming. The polished sheets will be then sent to KEK for half-cell forming and subsequent surface and material analysis before proceeding to half-cell welding. Former studies on the sample demonstrated that damages induced by forming can successfully be removed by recrystallization and less than 10 µm final chemistry.}},
}