SRF2017 - List of Authors (Tongu, H.)

Paper	Title	Page
THPB058	R&D of Thin Film Coating on Superconductors	877
	Y. Iwashita, H. Tongu Kyoto ICR, Uji, Kyoto, Japan H. Hayano, T. Kubo, T. Saeki KEK, Ibaraki, Japan M. Hino Kyoto University, Research Reactor Institute, Osaka, Japan H. Oikawa Utsunomiya University, Utsunomiya, Japan
	Funding: This research is partially supported by Grant-in-Aid for Exploratory Research JSPS KAKENHI Grant Number 26600142, and Photon and Quantum Basic Research Coordinated Development Program from the MEXT. Multilayer thin film coating is a promising technology to enhance performance of superconducting cavities. Until recently, principal parameters to achieve the sufficient performance had not been known, such as the thickness of each layer. We proposed a method to deduce a set of the parameters to exhibit a good performances. In order to verify the scheme, we are trying to make some experiments on the subject at Kyoto. The sample preparation and the test setup for the measurement apparatus will be discussed.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2017-THPB058
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Paper

Title

Page

R&D of Thin Film Coating on Superconductors

877

Y. Iwashita, H. Tongu
Kyoto ICR, Uji, Kyoto, Japan
H. Hayano, T. Kubo, T. Saeki
KEK, Ibaraki, Japan
M. Hino
Kyoto University, Research Reactor Institute, Osaka, Japan
H. Oikawa
Utsunomiya University, Utsunomiya, Japan

Funding: This research is partially supported by Grant-in-Aid for Exploratory Research JSPS KAKENHI Grant Number 26600142, and Photon and Quantum Basic Research Coordinated Development Program from the MEXT.
Multilayer thin film coating is a promising technology to enhance performance of superconducting cavities. Until recently, principal parameters to achieve the sufficient performance had not been known, such as the thickness of each layer. We proposed a method to deduce a set of the parameters to exhibit a good performances. In order to verify the scheme, we are trying to make some experiments on the subject at Kyoto. The sample preparation and the test setup for the measurement apparatus will be discussed.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2017-THPB058

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)