SRF2017 - List of Authors (Makita, J.)

Paper	Title	Page
MOPB035	Cryogenic Probe Station at Old Dominion University Center for Accelerator Science	128
	J. Makita, J.R. Delayen, A.V. Gurevich ODU, Norfolk, Virginia, USA G. Ciovati JLab, Newport News, Virginia, USA
	With a growing effort in research and development of an alternative material to bulk Nb for a superconducting radiofrequency (SRF) cavity, it is important to have a cost effective method to benchmark new materials of choice. At Old Dominion University's Center for Accelerator Science, a cryogenic probe station (CPS) will be used to measure the response of superconductor samples under RF fields. The setup consists of a closed-cycle refrigerator for cooling a sample wafer to a cryogenic temperature, a superconducting magnet providing a field parallel to the sample, and DC probes in addition to RF probes. The RF probes will extract a quality factor from a sample patterned in a coplanar waveguide resonator structure on a 2' wafer. From the measured quality factor, the surface resistance and the penetration depth as a function of temperature and magnetic field will be calculated. This paper will discuss the design and measurement procedures of the current CPS setup.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2017-MOPB035
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Paper

Title

Page

Cryogenic Probe Station at Old Dominion University Center for Accelerator Science

128

J. Makita, J.R. Delayen, A.V. Gurevich
ODU, Norfolk, Virginia, USA
G. Ciovati
JLab, Newport News, Virginia, USA

With a growing effort in research and development of an alternative material to bulk Nb for a superconducting radiofrequency (SRF) cavity, it is important to have a cost effective method to benchmark new materials of choice. At Old Dominion University's Center for Accelerator Science, a cryogenic probe station (CPS) will be used to measure the response of superconductor samples under RF fields. The setup consists of a closed-cycle refrigerator for cooling a sample wafer to a cryogenic temperature, a superconducting magnet providing a field parallel to the sample, and DC probes in addition to RF probes. The RF probes will extract a quality factor from a sample patterned in a coplanar waveguide resonator structure on a 2' wafer. From the measured quality factor, the surface resistance and the penetration depth as a function of temperature and magnetic field will be calculated. This paper will discuss the design and measurement procedures of the current CPS setup.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2017-MOPB035

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)