Author: Gurran, L.
Paper Title Page
TUPB104 First Full Cryogenic Test of the SRF Thin Film Test Cavity 644
 
  • R. Valizadeh, L. Bizel-Bizellot, P. Goudket, L. Gurran, O.B. Malyshev, N. Pattalwar, S.M. Pattalwar
    STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom
  • G. Burt, L. Gurran
    Lancaster University, Lancaster, United Kingdom
  • G. Burt, P. Goudket, O.B. Malyshev, S.M. Pattalwar, R. Valizadeh
    Cockcroft Institute, Warrington, Cheshire, United Kingdom
  • L. Gurran
    Cockcroft Institute, Lancaster University, Lancaster, United Kingdom
  
  A test cavity that uses RF chokes, rather than a physical seal, to contain the field is a promising method of SRF sample testing, especially in thin films research where the rate of sample production far outstrips that of full SRF characterisation. Having the sample and cavity physically separate reduces the complexity involved in changing samples - major causes of low throughput rate and high running costs for other test cavities - and also allows direct measurement of the RF power dissipated in the sample via power calorimetry. Choked test cavities operating at 7.8 GHz with three RF chokes have been designed and tested at Daresbury Laboratory. As part of the commissioning of this system, we performed the first full SRF test with a bulk Nb sample and we verified that the system would perform as required for future superconducting thin film sample tests.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2017-TUPB104  
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