Author: Four, A.
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TUYBA01 Progress on Characterization and Optimization of Multilayers 368
 
  • C.Z. Antoine
    CEA/DSM/IRFU, France
  • M. Aburas, A. Four
    CEA/DRF/IRFU, Gif-sur-Yvette, France
  • H. Hayano, S. Kato, T. Kubo, T. Saeki
    KEK, Ibaraki, Japan
  • Y. Iwashita
    Kyoto ICR, Uji, Kyoto, Japan
  
  Multilayers MgO/NbN/MgO/Nb with several thicknesses are being tested by local magnetometry, Scanning tunneling and various standard structural techniques experiment providing usefull information to compare experiments and recent theoretical advances proposed by A. Gurevich or T. Kubo.  
slides icon Slides TUYBA01 [5.819 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2017-TUYBA01  
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THPB038 Local Magnetometer: First Critical Field Measurement of Multilayer Superconductors 830
 
  • M. Aburas, C.Z. Antoine
    CEA/IRFU, Gif-sur-Yvette, France
  • A. Four
    CEA/DRF/IRFU, Gif-sur-Yvette, France
  
  S-I-S (Superconductor-Insulator-Superconductor) nanometric superconducting multilayers have been proposed by Gurevich* to increase the maximum accelerating field of Nb RF cavities. This enhancement of HC1 may be done by coating Nb with thin layers of thickness less than the penetration depth. Therefore, it is necessary to find a particular tool, which allows us measuring HC1 directly. In fact, DC magnetometers (e.g. magnetometer SQUID) are largely used for magnetic measurements but these last are strongly influenced by orientation, edge and shape effects, especially in the case of superconductor thin films. For that reason, we developed at Saclay facilities a specific local magnetic measurement of first critical field HC1. The principle of our local magnetometer is based on the third-harmonic voltage method purposed by Claassen**, which is very useful to estimate the first critical field HC1 of superconducting multilayer samples with nondestructive and contactless, but more importantly, without demagnetization effects***. This paper will present the evolution of the magnetometer to overcome all types of difficulties.
* A. Gurevich, Appl. Phys. Lett. 88, 012511 (2006)
** J. H. Claassen et al., Review of Scientific Instruments 62, 996 (1991)
*** M. Aurino et al., Journal of Applied Physics 98, 123901 (2005) 		 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2017-THPB038  
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