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RIS citation export for THPB029: XPS Studies of Nitrogen Doping Nb Samples before and after GCIB Etching

TY - CONF
AU - Yang, Z.Q.
AU - Lu, X.Y.
AU - Tan, W.W.
AU - Yang, D.Y.
AU - Yang, Y.
AU - Zhao, J.
ED - Schaa, Volker RW
ED - He, Yuan
ED - Li, Lu
ED - Zhao, Ning
TI - XPS Studies of Nitrogen Doping Nb Samples before and after GCIB Etching
J2 - Proc. of SRF2017, Lanzhou, China, July 17-21, 2017
C1 - Lanzhou, China
T2 - International Conference on RF Superconductivity
T3 - 18
LA - english
AB - The surface chemical composition of nitrogen doping Nb samples used for the fabrication of superconducting radio frequency (SRF) cavities, followed by the subsequent successive EP with different amounts of material removal, has been studied by XPS. The chemical composition of Nb, O, C and N was presented before and after Gas Cluster Ion Beams (GCIB) etching. No signals of bad superconducting nitrides NbNx was found in any doped and un-doped samples before etching. However, in the depth range greater than 30nm, the content of N elements is below the XPS detection precision scope even in the samples directly after nitrogen doping treatment.
PB - JACoW
CP - Geneva, Switzerland
SP - 802
EP - 804
KW - ion
KW - niobium
KW - cavity
KW - SRF
KW - electron
DA - 2018/01
PY - 2018
SN - 978-3-95450-191-5
DO - 10.18429/JACoW-SRF2017-THPB029
UR - http://jacow.org/srf2017/papers/thpb029.pdf
ER -