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RIS citation export for THPB024: Investigation on Depth Profiling of Niobium Surface Composition and Work Function of SRF Cavities

TY - CONF
AU - Wu, A.D.
AU - Chen, L.
AU - Chu, Q.W.
AU - Guo, H.
AU - He, Y.
AU - Li, Y.M.
AU - Pan, F.
AU - Yang, L.
AU - Zhang, S.H.
AU - Zhao, H.W.
ED - Schaa, Volker RW
ED - He, Yuan
ED - Li, Lu
ED - Zhao, Ning
TI - Investigation on Depth Profiling of Niobium Surface Composition and Work Function of SRF Cavities
J2 - Proc. of SRF2017, Lanzhou, China, July 17-21, 2017
C1 - Lanzhou, China
T2 - International Conference on RF Superconductivity
T3 - 18
LA - english
AB - The niobium samples were prepared by different surface treatments that commonly applied for the superconducting RF cavities preparation, as the following of electrochemical polishing, the buffered chemical polishing and high temperature annealing. In order to understand the property of niobium surface, especially the relationship between the composition and the work function value, the X-ray and ultraviolet photoelectron spectra depth profiling has been studied. The intensity photoelectrons signals of O1s, C1s and the Nb3d were identified for composition of the niobium oxide and the hydrocarbon contamination. And the work function of sample surface was measured via the means of the ultraviolet photoelectron spectra band width. To make a depth profiling, the sputtering of Argon ions was used to remove surface material gradually under by control the sputtering times. The results shown that the value of work function strongly depends on the chemical composition.
PB - JACoW
CP - Geneva, Switzerland
SP - 779
EP - 782
KW - ion
KW - niobium
KW - cavity
KW - electron
KW - SRF
DA - 2018/01
PY - 2018
SN - 978-3-95450-191-5
DO - 10.18429/JACoW-SRF2017-THPB024
UR - http://jacow.org/srf2017/papers/thpb024.pdf
ER -