Author: Kreps, G.
Paper Title Page
TUP053 Estimation of Small Geometry Deviation for TESLA-Shape Cavities Due to Inner Surface Polishing 537
 
  • A.A. Sulimov, G. Kreps, J.K. Sekutowicz
    DESY, Hamburg, Germany
 
  Two well know polishing methods are used for the inner surface cleaning of superconducting TESLA-shape cavities: electro-polishing (EP) or buffered chemical polishing (BCP). The amount of removed material is relatively small and varies from 10 till 140 um. The cavity after polishing is closed to prevent the scratches or dust appearing on its inner surface. The estimation of the removed material amount is possible by different criteria, for example by comparison of weight before and after cleaning, or by the time - cleaning procedure duration. Both calculations could give us only approximate average value of the removed material amount. We describe the method for estimation of small geometry deviation basing on RF frequency measurements, which allows calculating the different influence of surface treatment on the iris and equator areas.  
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