| Paper | Title | Page |
|---|
| WEP04 | Surface roughness characterization of niobium subjected to incremental BCP and EP processing steps | 438 |
| | - H. Tian, M. J. Kelley
TJNAF/College of William and Mary - G. Ribeill
North Carolina State University - C. E. Reece
TJNAF
| |
| | The surface of niobium samples polished under
incremental Buffered Chemical Polish (BCP) and Electro-
Polishing (EP) have been characterized through Atomic
Force Microscopy (AFM) and stylus profilometry across a
range of length of scales. The results were analyzed using
Power Density Spectral (PSD) technique to determine
roughness and characteristic dimensions. This study has
shown that the PSD method is a valuable tool that
provides quantitative information about surface roughness at different length scales. | |