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| MOPB001 |
Terahertz-Driven MeV Electron Bunch Compression and Streaking |
electron, FEM, simulation, laser |
14 |
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- Y. Xu, K. Fan, Z. Liu, Y. Song, C.-Y. Tsai, J. Wang
HUST, Wuhan, People’s Republic of China
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Electron bunches with ultra-short bunch length and ultra-high timing stability are crucial for various applications. To achieve these desired characteristics, there is a growing interest in employing Terahertz-driven techniques to manipulate and diagnose electron bunches. This paper presents a method capable of compressing and measuring electron bunch lengths. Theoretical and simulation results demonstrate that the bunch length of 54 is reduced to 4 fs by utilizing THz-driven resonant cavity compression, achieving a compression ratio of 13. Furthermore, we also verify the bunch compression using a terahertz-driven streak camera.
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| DOI • |
reference for this paper
※ doi:10.18429/JACoW-SAP2023-MOPB001
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| About • |
Received ※ 28 June 2023 — Revised ※ 09 July 2023 — Accepted ※ 11 July 2023 — Issued ※ 26 February 2024 |
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