| Title |
Page |
| A Method for LEBT Automation |
2133 |
- J. Sredniawski, C. Lom, Y. Ng, J. Porter, R. Schmidt, L. Solensten (Grumman Corporation), W. Newman (AMTEX)
|
|
| An Electrostatic Sweep Plate Device for Emittance Measurement of Ion Beams to 2 MeV |
2420 |
- T.W. Debiak, I. Birnbaum, R. Heuer, J. Porter (Grumman Corporation)
|
|