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Ueyama, D.

Paper Title Page
RPAP011 Technical Development of Profile Measurement for the Soft X-Ray Via Compton Backward Scattering 1260
 
  • T. Saito, Y. Hama, K. Hidume, S. Minamiguchi, A. Oshima, D. Ueyama, M. Washio
    RISE, Tokyo
  • H. Hayano, J.U. Urakawa
    KEK, Ibaraki
  • S. Kashiwagi
    ISIR, Osaka
  • R. Kuroda
    AIST, Tsukuba, Ibaraki
 
  A compact X-ray source is called for such various fields as material development, biological science, and medical treatment. At Waseda University, we have already succeeded to generate the soft X-ray of the wavelength within so-called water window region (250-500eV) via Compton backward scattering between 1047nm Nd:YLF laser and 4.2MeV high quality electron beam. Although this method equips some useful characters, e.g. high intensity, short pulse, energy variableness, etc, the X-ray generating system is compact enough to fit in tabletop size. In the next step, there rises two principal tasks, that is, to make the soft X-ray intensity higher, and to progress X-ray profile measurement techniques as preliminary experiments for biomicroscopy. Specifically, we utilize two-pass amp for the former, and irradiate X-ray to a resist film which is previously exposed by UV lamp or get images with X-ray CCD for the latter. In this conference, we will show the experimental results and some future plans.