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Meusel, O.

Paper Title Page
RPAT001 Experimental Results of a Non-Destructive Emittance Measurement Device for H- Beams 782
 
  • C. Gabor, H. Klein, O. Meusel, U. Ratzinger
    IAP, Frankfurt-am-Main
  • J. Pozimski
    Imperial College of Science and Technology, Department of Physics, London
 
  For the diagnostic of high power ion beams, non-destructive measurement devices should not only provide minimum influence on the beam itself, but also avoid various problems that occur when the high power density of the beam penetrates surfaces like slit- or pinhole plates. On the other hand, measurements of resolution should be comperable with destructive methods. Beams of negative ions offer the use of a non-destructive Emittance Measurement Instrument (EMI) based on the principle of photo detachment. Interaction of laser photons with the negative ions causes electron detachment. Due to moving the postion of the well collimated laser beam acros the ion beam the produced neutral atoms are well suited to detect the transverse beam emittance like a classical slit-grid device. After separation in a magnetic dipole, the neutrals can be viewed on a scintillator screen with a CCD camera. To investigate the use of such a photo detachment EMI and to study the transport of negative ions an experiment consisting of H minus ion source, electrostatic LEBT and EMI was constructed. The paper will present the setup of the experimental hardware and first results of measurements.