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Hseuh, B.

Paper Title Page
RPPT066 Electromigration Issues in High Current Horn 3700
 
  • W. Zhang, S. Bellavia, J. Sandberg, N. Simos, J.E. Tuozzolo, W.-T. Weng
    BNL, Upton, Long Island, New York
  • B. Hseuh
    JHU, Baltimore, Maryland
 
  Funding: Work performed under the auspices of the U.S. Department of Energy.

The secondary particle focusing horn for the AGS neutrino experiment proposal is a high current and high current density device. The peak current of horn is 300 kA. At the smallest area of horn, the current density is near 8 kA/mm2. At very high current density, a few kA/mm2, the electromigration phenomena will occur. Momentum transfer between electrons and metal atoms at high current density causes electromigration. The reliability and lifetime of focusing horn can be severely reduced by electromigration. In this paper, we discuss issues such as device reliability model, incubation time of electromigration, and lifetime of horn.