Paper |
Title |
Page |
TOAA010 |
On the Mechanism of Surface Roughness Wake Field Excitation |
167 |
|
- S. Ratschow, T. Weiland (Technische U. Darmstadt) , M. Timm (CST GmbH, Darmstadt, Germany)
|
|
RPAH105 |
Investigation of TTF Injector Alignment with the Simulation Code V |
3096 |
|
- R. Cee, W. Beinhauer, W. Koch, M. Krassilnikov, S. Ratschow, T. Weiland (Technische U. Darmstadt) , P. Castro, S. Schreiber (DESY) , A. Novokhatski (SLAC)
|
|
RPAH106 |
Beam-Based Alignment of TTF RF-Gun Using V-Code |
3099 |
|
- M. Krassilnikov, W. Beinhauer, R. Cee, W. Koch, S. Ratschow, T. Weiland (Technische U. Darmstadt) , P. Castro, S. Schreiber (DESY) , A. Novokhatski (SLAC)
|
|