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Author: Ratschow, S.

Paper Title Page
TOAA010 On the Mechanism of Surface Roughness Wake Field Excitation 167
 
  • S. Ratschow, T. Weiland (Technische U. Darmstadt) , M. Timm (CST GmbH, Darmstadt, Germany)
 
RPAH105 Investigation of TTF Injector Alignment with the Simulation Code V 3096
 
  • R. Cee, W. Beinhauer, W. Koch, M. Krassilnikov, S. Ratschow, T. Weiland (Technische U. Darmstadt) , P. Castro, S. Schreiber (DESY) , A. Novokhatski (SLAC)
 
RPAH106 Beam-Based Alignment of TTF RF-Gun Using V-Code 3099
 
  • M. Krassilnikov, W. Beinhauer, R. Cee, W. Koch, S. Ratschow, T. Weiland (Technische U. Darmstadt) , P. Castro, S. Schreiber (DESY) , A. Novokhatski (SLAC)
 

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