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RIS citation export for WEPOB35: LLNL Laser-Compton X-Ray Characterization

TY - CONF
AU - Hwang, Y.
AU - Anderson, G.G.
AU - Barty, C.P.J.
AU - Gibson, D.J.
AU - Marsh, R.A.
AU - Tajima, T.
ED - Schaa, Volker RW
ED - Power, Maria
ED - Shiltsev, Vladimir
ED - White, Marion
TI - LLNL Laser-Compton X-Ray Characterization
J2 - Proc. of NAPAC2016, Chicago, IL, USA, October 9-14, 2016
C1 - Chicago, IL, USA
T2 - North American Particle Accelerator Conference
T3 - 3
LA - english
AB - 30 keV Compton-scattered X-rays have been produced at LLNL. The flux, bandwidth, and X-ray source focal spot size have been characterized using an X-ray ICCD camera and results agree very well with modeling predictions. The RMS source size inferred from direct electron beam spot size measurement is 17 um , while imaging of the penumbra yields an upper bound of 42 um. The accuracy of the latter method is limited by the spatial resolution of the imaging system, which has been characterized as well, and is expected to improve after the upgrade of the X-ray camera later this year.
PB - JACoW
CP - Geneva, Switzerland
SP - 977
EP - 979
KW - ion
KW - electron
KW - laser
KW - simulation
KW - scattering
DA - 2017/01
PY - 2017
SN - 978-3-95450-180-9
DO - 10.18429/JACoW-NAPAC2016-WEPOB35
UR - https://jacow.org/napac2016/papers/wepob35.pdf
ER -