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RIS citation export for THPOA32: Sensitivity of the Microbunching Instability to Irregularities in Cathode Current in the LCLS-II Beam Delivery System

TY - CONF
AU - Mitchell, C.E.
AU - Emma, P.
AU - Qiang, J.
AU - Venturini, M.
ED - Schaa, Volker RW
ED - Power, Maria
ED - Shiltsev, Vladimir
ED - White, Marion
TI - Sensitivity of the Microbunching Instability to Irregularities in Cathode Current in the LCLS-II Beam Delivery System
J2 - Proc. of NAPAC2016, Chicago, IL, USA, October 9-14, 2016
C1 - Chicago, IL, USA
T2 - North American Particle Accelerator Conference
T3 - 3
LA - english
AB - LCLS-II is a high-repetition rate (1 MHz) Free Electron Laser (FEL) X-ray light source now under construction at SLAC National Accelerator Laboratory. During transport to the FEL undulators, the electron beam is subject to a space charge-driven microbunching instability that can degrade the electron beam quality and lower the FEL performance if left uncontrolled. The present LCLS-II design is well-optimized to control the growth of this instability out of the electron beam shot noise. However, the instability may also be seeded by irregularities in the beam current profile at the cathode (due to non-uniformities in the temporal profile of the photogun drive laser pulse). In this paper, we describe the sensitivity of the microbunching instability to small-amplitude temporal modulations on the emitted beam current profile at the cathode, using high-resolution simulations of the LCLS-II beam delivery system.
PB - JACoW
CP - Geneva, Switzerland
SP - 1171
EP - 1173
KW - ion
KW - cathode
KW - bunching
KW - undulator
KW - emittance
DA - 2017/01
PY - 2017
SN - 978-3-95450-180-9
DO - 10.18429/JACoW-NAPAC2016-THPOA32
UR - https://jacow.org/napac2016/papers/thpoa32.pdf
ER -