TUPYP034
IHEP, Beijing, People’s Republic of China
IHEP, Beijing, People’s Republic of China
IHEP, People’s Republic of China
| Paper | Title | Page |
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TUPYP034 |
A New Design of X-ray White Beam Profile Monitor for HEPS Beamlines | |
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| The development of x-ray white beam profile monitor is to realize the visual detection of beam contour and position under the condition of high energy and high heat load of HEPS fourth-generation light source. The device includes a electric drive system, an imaging system, and a copper-cooled CVD diamond monitor. SPECTRA and ANSYS were used to verify the mechanism temperature reliability when monitor being used in different HEPS beamlines at current of 200 mA. At the same time, the functional verification of the experimental prototype was carried out on the 3W1 high energy test beamline of BSRF, white beam fluorescence images were successfully obtained. During the test of Multilayer Monochromator for Structural Dvnamics Beamline(HEPS), the change images of white and monochromatic beam profiles and curve of intensity distribution during crystal adjustment are successfully obtained, which verificates the processing function of the monitor for beam profile and intensity distribution. | ||
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| TUPYP038 | A Design of an X-Ray Pink Beam Integrated Shutter for HEPS | 85 |
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| The main function of the shutter is to accurately control the exposure time of the sample so that the sample as well as the detector can be protected. In order to cover the high thermal load and high energy working environment, we designed an integrated shutter device. The device includes a thermal absorber shutter, a piezoelectric ceramic fast shutter, a vacuum chamber and an adjustable height base. Firstly SPECTRA and ANSYS were used to verify the device’s institutional temperature reliability at a thermal power density of 64W/mm2. In addition, the device is suitable for both monochromatic and pink light operation with a horizontal pitch of 15mm. The device is also compatible with both vacuum and atmospheric working environments, and the recollimation of the device is not necessary when switching modes. Finally, the thermal absorber shutter is also able to function as a beam profile monitor, and the position of the spot can be monitored through a viewing window on the cavity. | ||
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Poster TUPYP038 [0.781 MB] | |
| DOI • | reference for this paper ※ doi:10.18429/JACoW-MEDSI2023-TUPYP038 | |
| About • | Received ※ 08 November 2023 — Revised ※ 10 November 2023 — Accepted ※ 10 November 2023 — Issued ※ 18 December 2023 | |
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| TUPYP039 | A Design of an X-ray Monochromatic Adjustable Slit for HEPS Beamlines | 88 |
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| The monochromatic slit is a commonly used device in HEPS beamlines. It can limit the synchrotron beam-spot within a desired size required by the downstream optical equipment. In addition, the four-blade structure is the most widely used form of slit. The slit with this form usually consists of a pair or two parallel tungsten carbide blades. With their edges close to each other, a slit can be formed, and the size of which can be controlled by micromechanical guides. This structure is very suitable for the case of large beamsize. In this work, we have designed a monochromatic slit based on the four-blade form for BF-beamline in HEPS. It can be used in ultra-high vacuum, high luminous flux working environment. The maximum opening range is up to 30mm*10mm (H*V), while it can allow a white beam of 136mm*24mm (H*V) to pass through. Furthermore, we adopted a point to surface contact design, which can effectively avoid the over-constraint problem between two guide rails. | ||
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Poster TUPYP039 [0.457 MB] | |
| DOI • | reference for this paper ※ doi:10.18429/JACoW-MEDSI2023-TUPYP039 | |
| About • | Received ※ 10 November 2023 — Revised ※ 10 November 2023 — Accepted ※ 10 November 2023 — Issued ※ 18 July 2024 | |
| Cite • | reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml) | |