Author: Kohlstrunk, N.
Paper Title Page
WEPPP013 Mechanical Design and Integration of the SXP Scientific Instrument at the European XFEL 172
 
  • V.V. Vardanyan, D.G. Doblas-Jimenez, M. Dommach, P.G. Grychtol, M. Izquierdo, N. Kohlstrunk, D. La Civita, S. Molodtsov, O.J. Ohnesorge, T.E. Tikhodeeva, M. Vannoni
    EuXFEL, Schenefeld, Germany
  • J. Buck, R.K. Rossnagel
    DESY, Hamburg, Germany
  • S.G. Schönhense
    Johannes Gutenberg University Mainz, Institut für Physik, Mainz, Germany
  • T.S. Thiess
    IEAP, Kiel, Germany
 
  The Eu­ro­pean XFEL pro­vides fem­tosec­ond X-ray pulses with a MHz rep­e­ti­tion rate in an ex­tended pho­ton en­ergy range from 0.3 to 30 keV. Soft X-rays be­tween 0.3 and 3 keV are pro­duced in the SASE3 un­du­la­tor sys­tem, en­abling both spec­troscopy and co­her­ent dif­frac­tion imag­ing of atoms, mol­e­cules, clus­ters, ions and solids. The high rep­e­ti­tion rate opens the pos­si­bil­ity to per­form fem­tosec­ond time-re­solved pho­to­elec­tron spec­troscopy (TR-XPES) on solids. This tech­nique al­lows the si­mul­ta­ne­ous un­der­stand­ing of the evo­lu­tion of the elec­tronic, chem­i­cal and atomic struc­ture of solids upon an ul­tra­fast ex­ci­ta­tion. The re­al­iza­tion with soft X-rays re­quires the use of MHz FELs. In this con­tri­bu­tion, we pre­sent the me­chan­i­cal de­sign and ex­per­i­men­tal re­al­iza­tion of the SXP in­stru­ment. The main tech­ni­cal de­vel­op­ments of the in­stru­ment com­po­nents and the TR-XPES ex­per­i­men­tal setup are de­scribed.  
poster icon Poster WEPPP013 [1.253 MB]  
DOI • reference for this paper ※ doi:10.18429/JACoW-MEDSI2023-WEPPP013  
About • Received ※ 24 October 2023 — Revised ※ 04 November 2023 — Accepted ※ 07 November 2023 — Issued ※ 12 March 2024
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