Author: Buck, J.
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THPPP025
 Commissioning of the Intermediate Focus Setup at P04 at DESY  
 
  • F. Scholz, M. Hoesch, M.-J. Huang
    DESY, Hamburg, Germany
  • J. Buck, M. Kalläne
    CAU, Kiel, Germany
  • B. Pfau, M. Schneider
    MBI, Berlin, Germany
  
  The soft x-ray beamline P04 at PETRA III includes an experiment and beam-diagnostic station called Intermediate Focus (IF). The station holds an experimental station for soft x-ray scattering, as well as diagnostic and beam shaping equipment to propagate the beam further into the ASPHERE III setup of the University of Kiel (CAU). The IF station receives the beam over a pair of Kirkpatrick-Baez (KB) mirrors that produce 40 µm x 40 µm beam spot at the IF position. An additional set of KB mirrors inside the ASPHERE III instrument refocuses this spot into the ultimate focus. Among the beam shaping equipment, a set of interchangeable pinhole serve as a new source point. With a size between 5-100 µm they will produce a sub-micron beam size, which is less than 1 µm x 1 µm at the sample position. The IF station includes two features that will be presented: (a) A UHV switchyard that allows to bring either the scattering instrument or the beam shaper into the beam (collaboration with Max-Born-Institute Berlin). The switch between the setups works without breaking the vacuum. (b) The beam diagnostic and shaping assembly, including measurement and viewing components.  
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WEPPP013 Mechanical Design and Integration of the SXP Scientific Instrument at the European XFEL 172
 
  • V.V. Vardanyan, D.G. Doblas-Jimenez, M. Dommach, P.G. Grychtol, M. Izquierdo, N. Kohlstrunk, D. La Civita, S. Molodtsov, O.J. Ohnesorge, T.E. Tikhodeeva, M. Vannoni
    EuXFEL, Schenefeld, Germany
  • J. Buck, R.K. Rossnagel
    DESY, Hamburg, Germany
  • S.G. Schönhense
    Johannes Gutenberg University Mainz, Institut für Physik, Mainz, Germany
  • T.S. Thiess
    IEAP, Kiel, Germany
  
  The European XFEL provides femtosecond X-ray pulses with a MHz repetition rate in an extended photon energy range from 0.3 to 30 keV. Soft X-rays between 0.3 and 3 keV are produced in the SASE3 undulator system, enabling both spectroscopy and coherent diffraction imaging of atoms, molecules, clusters, ions and solids. The high repetition rate opens the possibility to perform femtosecond time-resolved photoelectron spectroscopy (TR-XPES) on solids. This technique allows the simultaneous understanding of the evolution of the electronic, chemical and atomic structure of solids upon an ultrafast excitation. The realization with soft X-rays requires the use of MHz FELs. In this contribution, we present the mechanical design and experimental realization of the SXP instrument. The main technical developments of the instrument components and the TR-XPES experimental setup are described.  
poster icon Poster WEPPP013 [1.253 MB]  
DOI • reference for this paper ※ doi:10.18429/JACoW-MEDSI2023-WEPPP013  
About • Received ※ 24 October 2023 — Revised ※ 04 November 2023 — Accepted ※ 07 November 2023 — Issued ※ 12 March 2024
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