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TY - CONF AU - Olea, G. AU - Huber, N. AU - Zeeb, J. ED - Jaski, Yifei ED - Den Hartog, Patric ED - Jaje, Kelly ED - Schaa, Volker R.W. TI - High-Precision Synchrotron Kappa Diffractometer J2 - Proc. of MEDSI2020, Chicago, IL, USA, 24-29 July 2021 CY - Chicago, IL, USA T2 - Mechanical Engineering Design of Synchrotron Radiation Equipment and Instrumentation T3 - 11 LA - english AB - A new research product aiming to work in a 3th generation synchrotron facility (PAL/PLS II) has been developed. Based on increased energy X-ray synchrotron radiation tool and well-known Kappa geometry device principle, the product is expected that will investigate atomic and molecular structures of materials at nanoscale level using several X-ray diffraction techniques. The Kappa diffractometer (K-Dm) machine is maintaining the common structural principle of its family, but working with an extreme precision and load, which is far of the competition. The main body is consisting from customized Kappa goniometer (KGm) device with vertical axis of rotation for high-precision sample (cryostat) manipulation, versatile detector arm (Da) for manipulating in horizontal plan different detectors (optics, slits, etc.) after X-ray beam is scattered and stable alignment base (Ab) for roughly adjusting the product around the X-ray beam. In addition, a XYZ cryo-carrier inside of the KGm is included for fine (submicron) sample adjustments. The kinematic, design and precision concepts applied, together with the obtained test results are all in detail presented.* PB - JACoW Publishing CP - Geneva, Switzerland SP - 163 EP - 166 KW - detector KW - synchrotron KW - alignment KW - synchrotron-radiation KW - electron DA - 2021/10 PY - 2021 SN - 2673-5520 SN - 978-3-95450-229-5 DO - doi:10.18429/JACoW-MEDSI2020-TUPB08 UR - https://jacow.org/medsi2020/papers/tupb08.pdf ER -