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RIS citation export for TUPB08: High-Precision Synchrotron Kappa Diffractometer

TY  - CONF
AU  - Olea, G.
AU  - Huber, N.
AU  - Zeeb, J.
ED  - Jaski, Yifei
ED  - Den Hartog, Patric
ED  - Jaje, Kelly
ED  - Schaa, Volker R.W.
TI  - High-Precision Synchrotron Kappa Diffractometer
J2  - Proc. of MEDSI2020, Chicago, IL, USA, 24-29 July 2021
CY  - Chicago, IL, USA
T2  - Mechanical Engineering Design of Synchrotron Radiation Equipment and Instrumentation
T3  - 11
LA  - english
AB  - A new research product aiming to work in a 3th generation synchrotron facility (PAL/PLS II) has been developed. Based on increased energy X-ray synchrotron radiation tool and well-known Kappa geometry device principle, the product is expected that will investigate atomic and molecular structures of materials at nanoscale level using several X-ray diffraction techniques. The Kappa diffractometer (K-Dm) machine is maintaining the common structural principle of its family, but working with an extreme precision and load, which is far of the competition. The main body is consisting from customized Kappa goniometer (KGm) device with vertical axis of rotation for high-precision sample (cryostat) manipulation, versatile detector arm (Da) for manipulating in horizontal plan different detectors (optics, slits, etc.) after X-ray beam is scattered and stable alignment base (Ab) for roughly adjusting the product around the X-ray beam. In addition, a XYZ cryo-carrier inside of the KGm is included for fine (submicron) sample adjustments. The kinematic, design and precision concepts applied, together with the obtained test results are all in detail presented.*
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 163
EP  - 166
KW  - detector
KW  - synchrotron
KW  - alignment
KW  - synchrotron-radiation
KW  - electron
DA  - 2021/10
PY  - 2021
SN  - 2673-5520
SN  - 978-3-95450-229-5
DO  - doi:10.18429/JACoW-MEDSI2020-TUPB08
UR  - https://jacow.org/medsi2020/papers/tupb08.pdf
ER  -