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| TH2A03 |
Complete Transverse 4D Beam Characterization for Ions Beams at Energies of Few MeV/u |
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- M.T. Maier, X. Du, P. Gerhard, L. Groening, S. Mickat, H. Vormann
GSI, Darmstadt, Germany
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Measurement of the ion beam rms-emittances is done through determination of the second order beam moments. For time being the moments quantifying the amount of inter-plane coupling, as <xy'> for instance, have been accessible to measurements just for very special cases of ions at energies below 200 keV/u using pepperpots. This talk presents successful measurements of all inter-plane coupling moments at 1 to 11 MeV/u. From first principles the used methods are applicable at all ion energies. The first campaign applied skewed quadrupoles in combination with a regular slit/grid emittance measurement device. The second campaign used a rotatable slit/grid device in combination with regular quadrupoles.
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Slides TH2A03 [17.343 MB]
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| DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-LINAC2016-TH2A03
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