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TY - CONF AU - Sulimov, A.A. AU - Giaretta, M. AU - Gresele, A. AU - Visentin, A. ED - Yamazaki, Yoshishige ED - Facco, Alberto ED - McCausey, Amy ED - Schaa, Volker RW TI - RF Analysis of Electropolishing for EXFEL Cavities Production at Ettore Zanon Spa J2 - Proc. of LINAC2016, East Lansing, MI, USA, 25-30 September 2016 C1 - East Lansing, MI, USA T2 - Linear Accelerator Conference T3 - 28 LA - english AB - After successful finishing of superconducting cavities mass production at Ettore Zanon S.p.A. (EZ) for the European XFEL (EXFEL), the authors had the possibility to provide a detailed analysis of the electropolishing (EP) process. The analysis of EP material removal is based on specified RF measurements and was used for the determination of both, the ratio between cavity's iris and equator and uniformity in different cells. A comparison of the RF measurements results with mechanical measurements is presented. PB - JACoW CP - Geneva, Switzerland SP - 544 EP - 546 KW - cavity KW - shielding KW - cathode KW - SRF KW - superconductivity DA - 2017/05 PY - 2017 SN - 978-3-95450-169-4 DO - 10.18429/JACoW-LINAC2016-TUPLR035 UR - http://jacow.org/linac2016/papers/tuplr035.pdf ER -